GaN metal-organic vapor phase epitaxy on Sc<sub>2</sub>O<sub>3</sub>/Si templates for group III-nitride monolithic integration to Si technology. [PDF]
Grinys T +6 more
europepmc +1 more source
Impact of Polarization Charges on Threshold Voltage and Band Offset in AlGaN/GaN Heterostructures
The threshold voltage for the two‐dimensional electron gas of GaN‐based heterostructures is analyzed by considering the thickness of the polarization charge region at a semiconductor surface and interface. The proposed model gives the threshold voltage agreed with experimental results.
Tetsuya Suemitsu +2 more
wiley +1 more source
Growth of rhombohedral-stacked single-crystal WS<sub>2</sub>/MoS<sub>2</sub> vertical heterostructures. [PDF]
Chen J +18 more
europepmc +1 more source
Crystallization of Semiconductor Thin Films by Flash Lamp Annealing
Flash lamp annealing is a thermal treatment on the millisecond time scale which can be used to crystallize thin semiconductor films. However, crystallization is a complex process showing a broad palette of different features depending on the boundary conditions.
Lars Rebohle +5 more
wiley +1 more source
Highly Oriented Epitaxial Hexagonal Boron Nitride Multilayers on High-Temperature-Resistant Single-Crystal Aluminum Nitride (0001). [PDF]
Yang X +10 more
europepmc +1 more source
Spectrally Tunable 2D Material‐Based Infrared Photodetectors for Intelligent Optoelectronics
Intelligent optoelectronics through spectral engineering of 2D material‐based infrared photodetectors. Abstract The evolution of intelligent optoelectronic systems is driven by artificial intelligence (AI). However, their practical realization hinges on the ability to dynamically capture and process optical signals across a broad infrared (IR) spectrum.
Junheon Ha +18 more
wiley +1 more source
Monolithic electro-optic platform on silicon with bandwidth of 100 GHz and beyond. [PDF]
Steckler D +12 more
europepmc +1 more source
Surface Reordering During Layer‐by‐Layer Growth on SrTiO3
Surface structures (left) derived from DFT‐constrained fitting to crystal truncation rods measured by synchrotron X‐ray scattering (right) after each monolayer of deposition during the MBE growth of SrTiO3${\rm SrTiO}_{3}$ (001). The bottom panel shows the bare substrate, the middle panel shows island formation upon deposition of a single layer of SrO,
I‐Cheng Tung +14 more
wiley +1 more source
Characterization of Complex Stacking of Semiconductors Through Near Field Imaging and Spectroscopy. [PDF]
Tailpied L +8 more
europepmc +1 more source
We combine altermagnet with topological insulators and subject the structure to Floquet driving. This breaks time‐reversal symmetry and creates a new type of higher‐order topological insulator. Its key feature is the emergence of programmable “0/π‐corner modes” that can be controlled by magnetic field direction, offering a novel dynamic platform for ...
Donghao Wang +4 more
wiley +1 more source

