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2022 8th International Conference on Signal Processing and Communication (ICSC), 2022
Bhavya Kumar +2 more
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Bhavya Kumar +2 more
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Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology
2024 IEEE International Reliability Physics Symposium (IRPS)Taiki Uemura +6 more
openaire +2 more sources
Performance improvement of gate-all-around (GAA) devices by optimized super-steep retrograde well
Microelectronics JournalQingkun Li +9 more
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The Effect of Gate Stack and High-ΔΈ Spacer on Device Performance of a Junctionless GAA FinFET
2020Rishu Chaujar, Bhavya Kumar
exaly

