Results 141 to 150 of about 3,848,811 (155)

Effects of Externally Applied Uniaxial Tensile Stress on Gate Induced Drain Leakage (GIDL) Current of Metal-Oxide-Semiconductor Transistors

ECS Meeting Abstracts, 2011
Abstract not Available.
openaire   +1 more source

Gate induced drain leakage in nanowire gate all around field effect transistors and methods to reduce GIDL

AIP Conference Proceedings, 2023
openaire   +1 more source

1TBulk eDRAM using Gate-Induced Drain-Leakage (GIDL) Current for High Speed and Low Power Applications

Extended Abstracts of the 2008 International Conference on Solid State Devices and Materials, 2008
Puget, S., Bossu, G., Berthollet, F., Mazoyer, P., Portal, Jean-Michel, Masson, P., Bouchakour, R., Skotnicki, T.   +7 more
openaire   +2 more sources

Reduction of Gate-Induced Drain Leakage (GIDL) Current in Single-Gate Ultra-Thin Body and Double-Gate FinFET Devices

Extended Abstracts of the 2002 International Conference on Solid State Devices and Materials, 2002
Yang-Kyu Choi, Daewon Ha, Tsu-Jae King, Jeffrey Bokor   +3 more
openaire   +1 more source

The Enhancement of Gate-Induced-Drain-Leakage (gidl) Current in Soi Mosfet and its Impact on Soi Device Scaling

IEEE International SOI Conference, 2005
null Jian Chen, F. Assaderaghi, null Ping-Keung Ko, null Chenming Hu   +3 more
openaire   +1 more source

Effectiveness of Repairing Hot Carrier Degradation in Si p-FinFETs Using Gate Induced Drain Leakage

IEEE Electron Device Letters, 2023
Huaxiang Yin, Anyan Du, Jun Luo
exaly  

Design of SOI FinFET on 32nm technology node for low standby power (LSTP) operation considering gate-induced drain leakage (GIDL)

Solid-State Electronics, 2010
Seongjae Cho, Byung Park, Kazuhiko Endo   +2 more
exaly  

METHOD AND DEVICE TO REDUCE GATE-INDUCED DRAIN LEAKAGE (GIDL) CURRENT IN THIN GATE OXIDE MOSFETS

2002
MOULI CHANDRA V, ROBERTS CEREDIG
openaire   +3 more sources

Enhanced gate induced drain leakage current in HfO2 MOSFETs

Microelectronic Engineering, 2009
Moshe Gurfinkel, John S Suehle
exaly  

Compact Modeling of Temperature-Dependent Gate-Induced Drain Leakage Including Low-Field Effects

IEEE Transactions on Electron Devices, 2019
Ananda Roy, Yogesh Singh Chauhan, Chetan Dabhi   +2 more
exaly