Results 151 to 157 of about 301 (157)

Comprehensive Analysis of Gate-Induced Drain Leakage in Vertically Stacked Nanowire FETs: Inversion-Mode Versus Junctionless Mode

IEEE Electron Device Letters, 2016
Jae Hur, Byung-Hyun Lee, Min-Ho Kang
exaly  

Spacer Design Guidelines for Nanowire FETs From Gate-Induced Drain Leakage Perspective

IEEE Transactions on Electron Devices, 2017
Shubham Sahay, M Jagadesh Kumar
exaly  

Compact Modeling of Temperature-Dependent Gate-Induced Drain Leakage Including Low-Field Effects

IEEE Transactions on Electron Devices, 2019
Chetan Kumar Dabhi, Ananda S Roy, Yogesh Singh Chauhan   +2 more
exaly  

Investigations on the Gate-Induced Drain Leakage Current of Polycrystalline-Silicon Thin-Film Transistor and Its Suppression With Drain Bias Sweep

IEEE Transactions on Electron Devices, 2016
Dongli Zhang, Mingxiang Wang, Huaisheng Wang   +2 more
exaly  

Dielectric pocket engineered, gate induced drain leakages (GIDL) and analog performance analysis of dual metal nanowire ferroelectric MOSFET (DPE-DM-NW-Fe FET) as an inverter

Microsystem Technologies
Shalu Garg, Jasdeep Kaur, Anubha Goel, Subhasis Haldar, R. S. Gupta   +4 more
openaire   +1 more source

Hot-carrier effects on gate-induced-drain-leakage (GIDL) current in thin-film SOI/NMOSFET's

IEEE Electron Device Letters, 1994
A Balasiński, T P Ma
exaly  

Gate-Induced-Drain-Leakage Current in 45-nm CMOS Technology

IEEE Transactions on Device and Materials Reliability, 2008
exaly