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Spacer Design Guidelines for Nanowire FETs From Gate-Induced Drain Leakage Perspective

IEEE Transactions on Electron Devices, 2017
Mamidala Jagadesh Kumar, Shubham Sahay
exaly  

Gate-Induced-Drain-Leakage Current in 45-nm CMOS Technology

IEEE Transactions on Device and Materials Reliability, 2008
exaly  

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