A residual-based deep learning approach for ghost imaging. [PDF]
Sci Rep, 2020 Bian T +5 more
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DeepGhost: real-time computational ghost imaging via deep learning. [PDF]
Sci Rep, 2020 Rizvi S, Cao J, Zhang K, Hao Q.
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Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory. [PDF]
Micromachines (Basel), 2023 An U +6 more
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The understanding of the impact of efficiently optimized underlap length on analog/RF performance parameters of GNR-FETs. [PDF]
Sci Rep, 2023 Ahmad MA, Kumar J.
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N-Type Nanosheet FETs without Ground Plane Region for Process Simplification. [PDF]
Micromachines (Basel), 2022 Lee KS, Park JY.
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Remote Plasma Selective Silicon Etching Enabled Tunable Sub-Fin Process for Improved Parasitic Bottom Channel Control in Gate-All-Around Nanosheet Field-Effect Transistors. [PDF]
Nanomaterials (Basel)Li J, Gao Y, Zhang DW.
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Inductive line tunneling FET using epitaxial tunnel layer with Ge-source and charge enhancement insulation. [PDF]
Discov Nano, 2023 Lin JT, Chang YC.
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Mathematical Modeling of Drain Current Estimation in a CSDG MOSFET, Based on La2O3 Oxide Layer with Fabrication-A Nanomaterial Approach. [PDF]
Nanomaterials (Basel), 2022 Gowthaman N, Srivastava VM.
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Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. [PDF]
Sensors (Basel), 2019 Chao CY +8 more
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Design and Study of a Novel P-Type Junctionless FET for High Performance of CMOS Inverter. [PDF]
Micromachines (Basel)Wang B +5 more
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