Results 121 to 130 of about 1,624 (169)

Techniques for Leakage Power Reduction in Nanoscale Circuits: A Survey [PDF]

, 2007
Liu, Wei
core  

Bioinformatics in Italy: BITS2011, the Eighth Annual Meeting of the Italian Society of Bioinformatics. [PDF]

BMC Bioinformatics, 2012
Romano P, Helmer-Citterich M.
europepmc   +1 more source

News [PDF]

, 2003
,
core  

Gidl, Anneliese, Alpenverein. Die Städter entdecken die Alpen

Revue de l’Institut français d’histoire en Allemagne, 2008
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Deletion of the <i>moe</i>A gene in <i>Flavobacterium</i> IR1 drives structural color shift from green to blue and alters polysaccharide metabolism. [PDF]

Elife
Escobar Doncel Á, Patinios C, Campos A, Walter Costa MB, Turkina MV, Murace M, Staals RHJ, Vignolini S, Dutilh BE, Ingham CJ.   +9 more
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Simultaneously Estimating Process Variation Effect, Work Function Fluctuation, and Random Dopant Fluctuation of Gate-All-Around Silicon Nanosheet Complementary Field-Effect Transistors. [PDF]

Nanomaterials (Basel)
Kola SR, Li Y.
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Comprehensive Review of FinFET Technology: History, Structure, Challenges, Innovations, and Emerging Sensing Applications. [PDF]

Micromachines (Basel)
Karimi K, Fardoost A, Javanmard M.
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Energy-balance modeling of short channel single-GB thin film transistors

, 2005
Mizuta, Hiroshi, Walker, P.
core  

CMOS Scaling for the 5 nm Node and Beyond: Device, Process and Technology. [PDF]

Nanomaterials (Basel)
Radamson HH, Miao Y, Zhou Z, Wu Z, Kong Z, Gao J, Yang H, Ren Y, Zhang Y, Shi J, Xiang J, Cui H, Lu B, Li J, Liu J, Lin H, Xu H, Li M, Cao J, He C, Duan X, Zhao X, Su J, Du Y, Yu J, Wu Y, Jiang M, Liang D, Li B, Dong Y, Wang G.   +30 more
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Study of GIDL Improvement for 2T-SONOS Flash

2020 China Semiconductor Technology International Conference (CSTIC), 2020
The improvement of Gate induced drain leakage (GIDL) is studied in 2T SONOS (silicon-oxide-nitride-oxide-silicon) nonvolatile memory. High GIDL current from the select gate (SG) introduce inhibit disturb to the neighbor SONOS gate. It is found that these leakage bits impact the overall yield and reliability.
Zhenghong Liu, Liqun Dong, Ruisheng Qi, Shugang Dai, Guanqun Huang, Haoyu Chen, Chris Shao   +6 more
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