Results 131 to 140 of about 354 (151)
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Low GIDL and Its Physical Origins in Si Nanowire Transistors
Extended Abstracts of the 2010 International Conference on Solid State Devices and Materials, 2010K. Zaitsu +4 more
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Impact of Hydrogen Anneal on Peripheral PMOS NBTI and Array Transistor GIDL in DRAM
2021 IEEE 14th International Conference on ASIC (ASICON), 2021Xiong Li +7 more
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Improvement in Junction Breakdown and GIDL using MFLA in DRAM Product
Journal of The Electrochemical Society, 2011Shian-Jyh Lin +10 more
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Mechanism of GIDL degradation induced by hot-carrier stresses in n-MOSFETs
2012link_to_subscribed_fulltext
Xu, Jingping, Lai, PT
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Crystallographic-orientation-dependent GIDL current in Tri-gate MOSFETs under hot carrier stress
Microelectronics Reliability, 2014Jong Tae Park
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Assessment of GIDL Reduction and Vth Modulation with Plasma Doped FinFETs
Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials, 2015J. M. Lee +5 more
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GIDL analysis of the process variation effect in gate-all-around nanowire FET
Solid-State Electronics, 2018Youngsoo Seo, Myounggon Kang
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Dependence on an oxide trap’s location of random telegraph noise (RTN) in GIDL current of n-MOSFET
Solid-State Electronics, 2014Hyungcheol Shin
exaly