Results 141 to 150 of about 354 (151)
Some of the next articles are maybe not open access.
Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique
IEEE Transactions on Electron Devices, 1998C -H Wang
exaly
The effects of STI induced mechanical strain on GIDL current in Hf-based and SiON MOSFETs
Solid-State Electronics, 2009Y K Fang, K C Lin, M S Liang
exaly
IEEJ Transactions on Electronics, Information and Systems
Tetsu Tanaka, Ryo Hasegawa
exaly +2 more sources
Tetsu Tanaka, Ryo Hasegawa
exaly +2 more sources
Investigation of GIDL RTN Mechanism in FinFET: Experimental Evidence and Theoretical Analysis
IEEE Transactions on Electron DevicesAnyi Zhu +4 more
openaire +1 more source

