Results 151 to 155 of about 445 (155)
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The effects of STI induced mechanical strain on GIDL current in Hf-based and SiON MOSFETs
Solid-State Electronics, 2009Y K Fang, Y T Hou, P F Hsu
exaly
Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique
IEEE Transactions on Electron Devices, 1998exaly
Investigation of GIDL RTN Mechanism in FinFET: Experimental Evidence and Theoretical Analysis
IEEE Transactions on Electron DevicesAnyi Zhu +4 more
openaire +1 more source

