Development of InAlN HEMTs for space application
This thesis investigates the emerging InAlN high electron mobility transistor (HEMT) technology with respect to its application in the space industry. The manufacturing processes and device performance of InAlN HEMTs were compared to AlGaN HEMTs, also ...
Smith, Matthew D.
core
Demonstration of TFTs 3D monolithically integrated on GaN HEMTs using cascode configuration with high breakdown voltage (> 1900 V). [PDF]
Wu TL +5 more
europepmc +1 more source
Numerical simulation of InN based HEMTs
Invented in 1980, High Electron Mobility Transistors(HEMTs) are now widely used in high-frequency electronics. They are fabricated in different material systems and a possible new material for future devices is indium nitride (InN).
VANDEMAELE, MICHIEL
core
Gate-Localized Fluorination Enables Enhancement-Mode AlGaN/GaN High-Electron Mobility Transistors. [PDF]
Kim DW +10 more
europepmc +1 more source
The keys to get high transconductance of AlGaAs/InGaAs/GaAs pseudomorphic HEMTs devices
There are two key points to get high transconductance of pseudomorphic HEMTS (pHEMTs) devices. From the point view of materials, the transfer efficiency of the electrons from the delta -doped AlGaAs layer to the InGaAs channel must be high.
Cao X +6 more
core
Novel Monolithic CAVET-HEMT Integration for Inverting-Switch Operation. [PDF]
Tan WH +7 more
europepmc +1 more source
Dietary recommendations for people with cystic fibrosis, a relevantly changing field. [PDF]
Mainz JG, Zagoya C.
europepmc +1 more source
GaN HEMTs device modeling and simulation
GaN HEMTs have garnered significant attention from power device and circuit design engineers due to their exceptional performance in high-temperature, high-speed, highfrequency, and high-power applications.
Zhang, Huimin
core
Optimization of enhancement-mode MIS-GaN HEMT with dual channel for simple process using TCAD simulation. [PDF]
Lee KH, Yang Y, Heo J, Kim JH.
europepmc +1 more source
An Improved Nonlinear Capacitance Model for GaN HEMTs Based on the Angelov Model. [PDF]
Miao Y, Yuan Q, Wang C, Cheng J.
europepmc +1 more source

