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Terahertz electrodynamics in high electron-mobility transistors

Journal of Applied Physics, 2013
Plasmon current, charge oscillations, and associated electromagnetic fields in the THz range of a two-dimensional electron gas forming the channel of a high electron mobility transistor have been analysed by solving the full set of Euler, continuity, and Maxwell equations.
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Radiation effects in high-electron-mobility transistors

Technical Physics Letters, 1999
The influence of 60Co γ radiation on the current-voltage characteristics of high electron mobility transistors is examined in the dose range from 1×104 to 6×108 R. No changes are observed up to a total dose of 1×107 R, but radiation-induced degradation of the transistors occurs when the dose exceeds 1× 108 R. The possible causes of the effects observed
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High Electron Mobility Transistors

2002
Prashant Chavarkar, Umesh Mishra
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High Electron Mobility Transistors (HEMTs)

2007
Prashant Chavarkar, Umesh Mishra
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