Results 51 to 60 of about 559,762 (225)

Open Fault Diagnosis and Tolerance Control for Grid-Connected Hybrid Active Neutral-Point- Clamped Inverters With Optimized Carrier-Based Pulse Width Modulation

open access: yesIEEE Access, 2020
This paper proposes open fault diagnosis and tolerance control methods for grid-connected hybrid active neutral-point-clamped (ANPC) inverters with optimized carrier-based pulse width modulation.
Ye-Ji Kim   +3 more
doaj   +1 more source

Organic Electrochemical Transistors for Neuromorphic Bioelectronics: Materials and Manufacturing Technologies

open access: yesAdvanced Science, EarlyView.
Organic electrochemical transistors bridge biological ionic signaling and neuromorphic computation through volumetric electrochemical gating. This review connects Organic mixed ionic–electronic conductor materials, device architectures, and manufacturing technologies to show how geometry, ion transport, and fabrication strategies program plasticity ...
Hyunjin Lee   +5 more
wiley   +1 more source

New Technology and Development Trend of Insulated Gate Bipolar Transistors

open access: yesKongzhi Yu Xinxi Jishu, 2017
IGBT with fine-pattern trench gate, thin drift region, field stop as well as enhanced carrier doping concentration in emitter side is the mainstream device structure at present.
ZHANG Jinping   +5 more
doaj  

Silicon Nitride Resistive Memories

open access: yesAdvanced Electronic Materials, EarlyView.
Amorphous SiNx is an attractive resistance switching material for ReRAM applications due to its physicochemical properties, such as humidity resistance, low oxygen diffusivity, and is used as a metal diffusion blocker. By modifying the ratio between N and Si atoms, the microstructure of the SiNx is affected, rendering it possible to change the ...
Alexandros‐Eleftherios Mavropoulis   +7 more
wiley   +1 more source

Efficient 3-D Simulation of Avalanche Breakdown and Transport in Wide-Area IGBT Corners

open access: yesIEEE Journal of the Electron Devices Society
We present a novel methodology to perform reliable and efficient three-dimensional (3D) wide-area simulations of avalanche breakdown in the corners of insulated gate bipolar transistors (IGBTs), based on approximations in the trench-gate and source ...
Massimiliano Galvagno   +8 more
doaj   +1 more source

Least Squares Method for Identification of IGBT Thermal Impedance Networks Using Direct Temperature Measurements

open access: yesEnergies, 2020
State-of-the-art methods for determining thermal impedance networks for IGBT (Insulated Gate Bipolar Transistor) modules usually involves the establishment of the relationship between the measured transistor or diode voltage and temperature under ...
Humphrey Mokom Njawah Achiri   +3 more
doaj   +1 more source

Stochastic‐MTJ Sampler Arrays for In‐Array Monte–Carlo Estimation

open access: yesAdvanced Electronic Materials, EarlyView.
A low‐energy‐barrier magnetic tunnel junction array is operated as a probability‐domain sampler: each cell's random switching, programmed through a shared digital‐to‐analog converter, makes the per‐column multiply–accumulate an unbiased Monte–Carlo expectation estimator that returns both a mean and a calibrated uncertainty.
Ran Zhang   +6 more
wiley   +1 more source

Precharge switch based on metal-oxide-semiconductor-controlled thyristor for power relay assembly of battery electric vehicles

open access: yesETRI Journal
The power relay assembly (PRA) is an essential component to ensure the safety of an electric vehicle. We propose a semiconductor-based precharge switch to overcome the shortcomings of the conventional mechanical relay, which is currently used as the ...
Dong Yun Jung   +6 more
doaj   +1 more source

Physics‐Grounded Probabilistic Bits for Hardware‐Efficient Intelligent Inference and Optimization

open access: yesAdvanced Intelligent Systems, EarlyView.
Si–SiNx interface traps are harnessed as a complementary metal–oxide–semiconductor‐compatible source of controllable randomness for probabilistic bits. Pulse‐width‐programmed stochastic capture converts nanoscale defect dynamics into Boltzmann‐consistent binary outputs, while a physics‐based Simulation Program with Integrated Circuit Emphasis model ...
Dokyoung Lee   +3 more
wiley   +1 more source

Fabrication of 30nm T-gate high electron mobility transistors using a bi-Layer of PMMA and UVIII [PDF]

open access: yes, 2004
This work reports on the development and fabrication of High Electron Mobility Transistors with a gate length of less than 30nm. The T-shaped gates were realized using a two-stage "bi-lithography" process that creates a T-shaped image in a bilayer of
Moran, D.A.J.   +11 more
core   +1 more source

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