High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy [PDF]
Nature Communications, 2023 Unraveling local dynamic charge processes is vital for progress in diverse fields, from microelectronics to energy storage. This relies on the ability to map charge carrier motion across multiple length- and timescales and understanding how these ...
Marti Checa +14 more
doaj +2 more sources
Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2020 Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated.
Christian Ritz +2 more
doaj +2 more sources
Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy [PDF]
Physical Review Letters, 2009 A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force Microscope/KPFM ...
Bocquet, Franck +3 more
core +8 more sources
High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes [PDF]
Nanotechnology, 2012 Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force.
Brown, Keith A. +2 more
core +5 more sources
Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy [PDF]
Light: Science & Applications, 2021 Organic–inorganic halide perovskites are emerging materials for photovoltaic applications with certified power conversion efficiencies (PCEs) over 25%.
Ting-Xiao Qin +7 more
doaj +2 more sources
Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy [PDF]
Nanoscale Research Letters, 2018 Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy.
Jongjin Lee, Jaemin Kong
doaj +2 more sources
Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy. [PDF]
ACS Nano, 2018 There are currently no experimental techniques that combine atomic-resolution imaging with elemental sensitivity and chemical fingerprinting on single molecules. The advent of using molecular-modified tips in noncontact atomic force microscopy (nc-AFM) has made it possible to image (planar) molecules with atomic resolution.
Schulz F +5 more
europepmc +6 more sources
Kelvin probe force microscopy for local characterisation of active nanoelectronic devices [PDF]
Beilstein Journal of Nanotechnology, 2015 Frequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for high resolution measurements of local surface potentials, yet on coarse topographic structures most researchers revert to amplitude modulated lift-mode techniques for ...
Tino Wagner +6 more
doaj +2 more sources
Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals [PDF]
Beilstein Journal of Nanotechnology, 2018 In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM).
Yann Almadori +4 more
doaj +2 more sources
Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices [PDF]
Beilstein Journal of Nanotechnology, 2018 In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film ...
Amelie Axt +4 more
doaj +2 more sources