Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions. [PDF]
J Phys Chem C Nanomater InterfacesKelvin probe force microscopy (KPFM) is an increasingly popular scanning probe microscopy technique used for nanoscale imaging of surface potential for various materials, such as metals, semiconductors, biological samples, and photovoltaics, to reveal ...
Zahmatkeshsaredorahi A, Jakob DS, Xu XG.
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Artifacts in time-resolved Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2018 Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest.
Sascha Sadewasser +2 more
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Kelvin probe force microscopy in liquid using electrochemical force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2015 Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface.
Liam Collins +6 more
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Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes [PDF]
Beilstein Journal of Nanotechnology, 2013 Dye-sensitized solar cells (DSCs) provide a promising third-generation photovoltaic concept based on the spectral sensitization of a wide-bandgap metal oxide.
Alex Henning +8 more
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Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy. [PDF]
ACS Nano, 2018 There are currently no experimental techniques that combine atomic-resolution imaging with elemental sensitivity and chemical fingerprinting on single molecules.
Schulz F +5 more
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Kelvin Probe Force Microscopy and Electrochemical Atomic Force Microscopy Investigations of Lithium Nucleation and Growth: Influence of the Electrode Surface Potential. [PDF]
J Phys Chem LettLithium metal is promising for high-capacity batteries because of its high theoretical specific capacity of 3860 mAh g–1 and low redox potential of −3.04 V versus the standard hydrogen electrode.
To-A-Ran W +4 more
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High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method [PDF]
Data in Brief, 2020 This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park +3 more
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Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2022 Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in ...
Masato Miyazaki +2 more
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Peak Force Infrared - Kelvin Probe Force Microscopy.
Angewandte Chemie, 2020 Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provides insight into structure-functional relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a
D. Jakob +5 more
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Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode [PDF]
Beilstein Journal of Nanotechnology, 2021 The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be
Gheorghe Stan, Pradeep Namboodiri
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