Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2020 Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated.
Christian Ritz +2 more
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Direct observation of localized surface plasmon field enhancement by Kelvin probe force microscopy. [PDF]
Light Sci Appl, 2017 A surface plasmon (SP) is a fundamental excitation state that exists in metal nanostructures. Over the past several years, the performance of optoelectronic devices has been improved greatly via the SP enhancement effect.
Li DB +7 more
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Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy [PDF]
Nanoscale Research Letters, 2018 Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy.
Jongjin Lee, Jaemin Kong
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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices [PDF]
Beilstein Journal of Nanotechnology, 2015 Frequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for high resolution measurements of local surface potentials, yet on coarse topographic structures most researchers revert to amplitude modulated lift-mode techniques for ...
Tino Wagner +6 more
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Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation. [PDF]
Beilstein J Nanotechnol, 2019 Controlling the work function of transition metal oxides is of key importance with regard to future energy production and storage. As the majority of applications involve the use of heterostructures, the most suitable characterization technique is Kelvin
Wrana D +5 more
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Numerical analysis of single-point spectroscopy curves used in photo-carrier dynamics measurements by Kelvin probe force microscopy under frequency-modulated excitation [PDF]
Beilstein Journal of Nanotechnology, 2018 In recent years, the investigation of the complex interplay between the nanostructure and photo-transport mechanisms has become of crucial importance for the development of many emerging photovoltaic technologies.
Pablo A. Fernández Garrillo +2 more
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Kelvin probe force microscopy for material characterization [PDF]
Microscopy, 2022 Abstract Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic force microscopy. The surface potential is one of the most important surface properties and is correlated to e.g. the work function, surface dipoles, localized surface charges and structural properties.
Thilo Glatzel, Urs Gysin, Ernst Meyer
openaire +3 more sources
In situ microscopic investigation of ion migration on the surface of chromium coated steels
npj Materials Degradation, 2022 Cathodic spreading of electrolyte on two-layers chromium coatings electrodeposited from trivalent chromium electrolyte on steel was studied on the micro- and the macroscale. The behavior is discussed in view of results obtained on electrical conductivity
J. Manoj Prabhakar +2 more
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High–low Kelvin probe force spectroscopy for measuring the interface state density
Beilstein Journal of Nanotechnology, 2023 The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface states with high spatial resolution using high and low AC bias frequencies compared with the cutoff frequency of the carrier ...
Ryo Izumi +3 more
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Atomic force microscopy in energetic materials research: A review
Energetic Materials Frontiers, 2022 Modern trends in the development of energetic materials include the various methods of particle surface modification and the widespread use of nanosized powders.
Ekaterina K. Kosareva +2 more
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