Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy [PDF]
Nanoscale Research Letters, 2018 Graphene oxide (GO) films were formed by drop-casting method and were studied by FTIR spectroscopy, micro-Raman spectroscopy (mRS), X-ray photoelectron spectroscopy (XPS), four-points probe method, atomic force microscopy (AFM), and scanning Kelvin probe
Oleksandr M. Slobodian +7 more
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Numerical analysis of single-point spectroscopy curves used in photo-carrier dynamics measurements by Kelvin probe force microscopy under frequency-modulated excitation [PDF]
Beilstein Journal of Nanotechnology, 2018 In recent years, the investigation of the complex interplay between the nanostructure and photo-transport mechanisms has become of crucial importance for the development of many emerging photovoltaic technologies.
Pablo A. Fernández Garrillo +2 more
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Kelvin probe force microscopy for material characterization [PDF]
Microscopy, 2022 Abstract Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic force microscopy. The surface potential is one of the most important surface properties and is correlated to e.g. the work function, surface dipoles, localized surface charges and structural properties.
Thilo Glatzel, Urs Gysin, Ernst Meyer
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In situ microscopic investigation of ion migration on the surface of chromium coated steels
npj Materials Degradation, 2022 Cathodic spreading of electrolyte on two-layers chromium coatings electrodeposited from trivalent chromium electrolyte on steel was studied on the micro- and the macroscale. The behavior is discussed in view of results obtained on electrical conductivity
J. Manoj Prabhakar +2 more
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High–low Kelvin probe force spectroscopy for measuring the interface state density
Beilstein Journal of Nanotechnology, 2023 The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface states with high spatial resolution using high and low AC bias frequencies compared with the cutoff frequency of the carrier ...
Ryo Izumi +3 more
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Peak Force Infrared–Kelvin Probe Force Microscopy
Angewandte Chemie, 2020 AbstractCorrelative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure–function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge.
Devon S. Jakob +5 more
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Atomic force microscopy in energetic materials research: A review
Energetic Materials Frontiers, 2022 Modern trends in the development of energetic materials include the various methods of particle surface modification and the widespread use of nanosized powders.
Ekaterina K. Kosareva +2 more
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MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy
Crystals, 2020 A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko +3 more
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Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications. [PDF]
PLoS ONE, 2017 Charge trapping properties of electrons and holes in copper-doped zinc oxide (ZnO:Cu) films have been studied by scanning probe microscopy. We investigated the surface potential dependence on the voltage and duration applied to the copper-doped ZnO films
Ting Su, Haifeng Zhang
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Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces [PDF]
, 2015 Kelvin probe force microscopy is a widely used technique for measuring surface potential distributions on the micro- and nanometer scale. The data are, however, often analyzed qualitatively, especially for dielectrics.
Nielsen, Dennis Achton +2 more
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