Results 51 to 60 of about 25,000 (165)

Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy

Materials Research Express, 2020
In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma, Deepak Varandani, Mylene Hendrickx, Joke Hadermann, B R Mehta   +4 more
doaj   +1 more source

Spatially resolved penetration depth measurements and vortex manipulation in the ferromagnetic superconductor ErNi2B2C [PDF]

, 2015
We present a local probe study of the magnetic superconductor, ErNi$_2$B$_2$C, using magnetic force microscopy at sub-Kelvin temperatures. ErNi$_2$B$_2$C is an ideal system to explore the effects of concomitant superconductivity and ferromagnetism.
Bud’ko, Sergey, Canfield, Paul, Canfield, Paul, Choi, Hee Cheul, Kim, Jeehoon, Lee, Minkyung, Wulferding, Dirk, Yang, Ilkyu, Yang, Jinho, Yeom, Han Woong   +9 more
core   +4 more sources

Combined Kelvin probe force microscopy and secondary ion mass spectrometry for hydrogen detection in corroded 2024 aluminium alloy [PDF]

, 2013
The capability of Kelvin probe force microscopy (KFM) to detect and locate hydrogen in corroded 2024 aluminium alloy was demonstrated. Hydrogen was introduced inside the 2024 alloy following a cyclic corrosion test consisting of cycles of immersion in 1 ...
Alexis, Joël, Andrieu, Eric, Blanc, Christine, Lacroix, Loïc, Larignon, Céline, Odemer, Grégory   +5 more
core   +3 more sources

Charge erasure analysis on the nanoscale using Kelvin probe force microscopy

AIP Advances, 2017
The charge pattern produced by atomic force microscopy on an insulating surface can be detected on the nanoscale using Kelvin probe force microscopy. Recent applications of charge patterns include data storage, nano-xerography, and charge writing.
Shi-quan Lin, Tian-min Shao
doaj   +1 more source

Quantitative AC - Kelvin Probe Force Microscopy

Microelectronic Engineering, 2017
This paper presents a novel feedback based Scanning Probe Microscopy method which enables quantitative surface potential measurements without the need of the DC bias of Kelvin Probe Force Microscopy. In addition to the sinusoidal excitation signal at frequency , a sinusoidal signal with the frequency 2 is applied to the conductive cantilever.
Kohl, Dominik, Mesquida, Patrick, Schitter, Georg   +2 more
openaire   +4 more sources

Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications

Applied Microscopy, 2021
Neuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand
Young-Min Kim, Jihye Lee, Deok-Jin Jeon, Si-Eun Oh, Jong-Souk Yeo   +4 more
doaj   +1 more source

Imaging Ferroelectric Domains via Charge Gradient Microscopy Enhanced by Principal Component Analysis

, 2017
Local domain structures of ferroelectrics have been studied extensively using various modes of scanning probes at the nanoscale, including piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM), though none of these techniques ...
Esfahani, Ehsan Nasr, Li, Jiangyu, Liu, Xiaoyan   +2 more
core   +2 more sources

Characterization of Corrosion Interfaces by the Scanning Kelvin Probe Force Microscopy Technique [PDF]

, 2001
A variety of interfaces relevant to corrosion processes were examined by the scanning Kelvin probe force microscopy (SKPFM) technique in order to study the influences of various parameters on the measured potential. SKPFM measurements performed on AA2024-
Buchheit, Chi, Feser, Fujihira, Fujihira, G. S. Frankel, Guillaumin, Hansen, Hansen, Hansen, Hansen, Hansen, Hansen, Hansen, Henning, Huey, Jacobs, Kizhakevariam, Kolb, Leng, Leng, Lobnig, Martin, P. Schmutz, Rath, Schmutz, Schmutz, Schmutz, Shin, Splinter, Stratmann, Stratmann, Stratmann, Stratmann, Trasatti, V. Guillaumin, Warner, Williams, Yasutake, Yee, Yokoyama   +40 more
core   +1 more source

Nondestructive Method for Mapping Metal Contact Diffusion in In2O3 Thin-Film Transistors [PDF]

, 2016
The channel width-to-length ratio is an important transistor parameter for integrated circuit design. Contact diffusion into the channel during fabrication or operation alters the channel width and this important parameter.
Girtan M., Isam Abdullah, John Emyr Macdonald, Karol Kalna, Li C., Martin Elliott, Olga Kryvchenkova, Petar Igić, Richard J. Cobley, Robertson J., Schönherr H., Thomas D. Anthopoulos, Yen-Hung Lin   +12 more
core   +2 more sources

Dissipation Modulated Kelvin Probe Force Microscopy Method

, 2018
We review a new implementation of Kelvin probe force microscopy (KPFM) in which the dissipation signal of frequency modulation atomic force microscopy (FM-AFM) is used for dc bias voltage feedback (D-KPFM). The dissipation arises from an oscillating electrostatic force that is coherent with the tip oscillation, which is caused by applying the ac ...
Miyahara, Yoichi, Grutter, Peter
openaire   +2 more sources