Results 1 to 10 of about 4,678 (130)

Thin NaCl films on silver (001): island growth and work function

New Journal of Physics, 2012
The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy.
Gregory Cabailh, Claude R Henry, Clemens Barth   +2 more
doaj   +2 more sources

AFM-assisted fabrication of thiol SAM pattern with alternating quantified surface potential [PDF]

Nanoscale Research Letters, 2011
Thiol self-assembled monolayers (SAMs) are widely used in many nano- and bio-technology applications. We report a new approach to create and characterize a thiol SAMs micropattern with alternating charges on a flat gold-coated substrate using atomic ...
Simons Janet, Xu Song, Moores Bradley, Leonenko Zoya   +3 more
doaj   +3 more sources

Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis

Journal of Materiomics, 2017
Local domain structures of ferroelectrics have been studied extensively using various modes of scanning probes at the nanoscale, including piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM), though none of these techniques ...
Ehsan Nasr Esfahani, Xiaoyan Liu, Jiangyu Li   +2 more
doaj   +4 more sources

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Beilstein Journal of Nanotechnology, 2022
Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in ...
Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li   +2 more
doaj   +1 more source

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

Beilstein Journal of Nanotechnology, 2023
In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination.
Zeinab Eftekhari, Nasim Rezaei, Hidde Stokkel, Jian-Yao Zheng, Andrea Cerreta, Ilka Hermes, Minh Nguyen, Guus Rijnders, Rebecca Saive   +8 more
doaj   +1 more source

High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method

Data in Brief, 2020
This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park, Joon Sik Park, Choong-Heui Chung, Sangyeob Lee   +3 more
doaj   +1 more source

Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination

EPJ Photovoltaics, 2022
Solar cells are complex devices, being constituted of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. This paper applies Kelvin probe force microscopy (
da Lisca Mattia, Connolly James P., Alvarez José, Mekhazni Karim, Vaissiere Nicolas, Decobert Jean, Kleider Jean-Paul   +6 more
doaj   +1 more source

Compensating for artifacts in scanning near-field optical microscopy due to electrostatics

APL Photonics, 2021
Nanotechnology and modern materials science demand reliable local probing techniques on the nanoscopic length scale. Most commonly, scanning probe microscopy methods are applied in numerous variants and shades, for probing the different sample properties.
Tobias Nörenberg, Lukas Wehmeier, Denny Lang, Susanne C. Kehr, Lukas M. Eng   +4 more
doaj   +1 more source

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

Beilstein Journal of Nanotechnology, 2021
The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be
Gheorghe Stan, Pradeep Namboodiri
doaj   +1 more source

Standardization of surface potential measurements of graphene domains [PDF]

, 2013
We compare the three most commonly used scanning probe techniques to obtain a reliable value of the work function in graphene domains of different thickness.
Kazakova, Olga, Panchal, Vishal, Pearce, Ruth, Tzalenchuk, Alexander, Yakimova, Rositza   +4 more
core   +2 more sources