Results 11 to 20 of about 4,697 (147)

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

Beilstein Journal of Nanotechnology, 2018
In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film ...
Amelie Axt, Ilka M. Hermes, Victor W. Bergmann, Niklas Tausendpfund, Stefan A. L. Weber   +4 more
doaj   +2 more sources

Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications

Applied Microscopy, 2021
Neuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand
Young-Min Kim, Jihye Lee, Deok-Jin Jeon, Si-Eun Oh, Jong-Souk Yeo   +4 more
doaj   +1 more source

Implementation of data-cube pump–probe KPFM on organic solar cells

Beilstein Journal of Nanotechnology, 2020
An implementation of pump–probe Kelvin probe force microscopy (pp-KPFM) is reported that enables recording the time-resolved surface potential in single-point mode or over a 2D grid. The spectroscopic data are acquired in open z-loop configuration, which
Benjamin Grévin, Olivier Bardagot, Renaud Demadrille   +2 more
doaj   +1 more source

Controlled manipulation of oxygen vacancies using nanoscale flexoelectricity [PDF]

, 2017
Oxygen vacancies, especially their distribution, are directly coupled to the electromagnetic properties of oxides and related emergent functionalities that have implication in device applications.
Cao, Ye, Chen, Long-Qing, Cho, Myung Rae, Das, Saikat, Kalinin, Sergei V., Kim, Minu, Noh, Tae Won, Shin, Yeong Jae, Wang, Bo, Wang, Lingfei, Yang, Sang Mo   +10 more
core   +3 more sources

The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

AIP Advances, 2013
The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM) and Kelvin probe force microscopy (KPFM).
Yuanmin Du, Amit Kumar, Hui Pan, Kaiyang Zeng, Shijie Wang, Ping Yang, Andrew Thye Shen Wee   +6 more
doaj   +1 more source

Dipole-field-assisted charge extraction in metal-perovskite-metal back-contact solar cells [PDF]

, 2017
Hybrid organic-inorganic halide perovskites are low-cost solution-processable solar cell materials with photovoltaic properties that rival those of crystalline silicon.
Bach, Udo, Bao, Qiaoliang, Cheng, Yibing, Chesman, Anthony S. R., Duffy, Noel W., Fournier, Maxime, Gomez, Daniel E., Jumabekov, Askhat N., Lal, Niraj N., Lin, Xiongfeng, Pascoe, Alexander R., Sears, Kallista, Spiccia, Leone, Zhang, Yupeng   +13 more
core   +3 more sources

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

Beilstein Journal of Nanotechnology, 2022
In this paper, we derive and present quantitative expressions governing the performance of single and multifrequency Kelvin probe force microscopy (KPFM) techniques in both air and water.
Jason I. Kilpatrick, Emrullah Kargin, Brian J. Rodriguez   +2 more
doaj   +1 more source

The role of the cantilever in Kelvin probe force microscopy measurements

Beilstein Journal of Nanotechnology, 2011
The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever.
George Elias, Thilo Glatzel, Ernst Meyer, Alex Schwarzman, Amir Boag, Yossi Rosenwaks   +5 more
doaj   +1 more source

Ag Nanocluster Production through DC Magnetron Sputtering and Inert Gas Condensation: A Study of Structural, Kelvin Probe Force Microscopy, and Optical Properties

Nanomaterials, 2023
Silver nanoclusters are valuable for a variety of applications. A combination of direct current (DC) magnetron sputtering and inert gas condensation methods, employed within an ultra-high vacuum (UHV) system, was used to generate Ag nanoclusters with an ...
Ishaq Musa, Naser Qamhieh, Saleh T. Mahmoud   +2 more
doaj   +1 more source

Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy [PDF]

, 2009
A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force Microscope/KPFM ...
Bocquet, Franck, Foster, Adam S., Loppacher, Christian, Nony, Laurent   +3 more
core   +4 more sources