Beilstein Journal of Nanotechnology, 2015 Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin +6 more
doaj +1 more source
KPFM surface photovoltage measurement and numerical simulation
EPJ Photovoltaics, 2019 A method for the analysis of Kelvin probe force microscopy (KPFM) characterization of semiconductor devices is presented. It enables evaluation of the influence of defective surface layers.
Marchat Clément +5 more
doaj +1 more source
Crystallographic order and decomposition of [MnIII6CrIII]3+ single-molecule magnets deposited in submonolayers and monolayers on HOPG studied by means of molecular resolved Atomic Force Microscopy (AFM) and Kelvin Probe Force Microscopy in UHV [PDF]
, 2014 Gryzia A, Volkmann T, Brechling A, et al. Crystallographic order and decomposition of [MnIII6CrIII]3+ single-molecule magnets deposited in submonolayers and monolayers on HOPG studied by means of molecular resolved Atomic Force Microscopy (AFM) and ...
Brechling, Armin +7 more
core +2 more sources
Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces [PDF]
, 2015 Kelvin probe force microscopy is a widely used technique for measuring surface potential distributions on the micro- and nanometer scale. The data are, however, often analyzed qualitatively, especially for dielectrics.
Nielsen, Dennis Achton +2 more
core +2 more sources
Analysis of multi-center topological domain states in BiFeO3 nanodot arrays
Journal of Advanced Dielectrics, 2023 High-density ferroelectric BiFeO3 (BFO) nanodot arrays were developed through template-assisted tailoring of epitaxial thin films. By combining piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM) imaging techniques, we found ...
Zhongwen Li +3 more
doaj +1 more source
High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers
IEEE Access, 2019 Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang +5 more
doaj +1 more source
Beilstein Journal of Nanotechnology, 2023 Multilayer III–V-based solar cells are complex devices consisting of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement.
Mattia da Lisca +6 more
doaj +1 more source
, 2014 29th European Photovoltaic Solar Energy Conference and Exhibition; 830 ...
Sommer, Daniel +5 more
openaire +2 more sources
The Importance of Cantilever Dynamics in the Interpretation of Kelvin Probe Force Microscopy [PDF]
, 2012 A realistic interpretation of the measured contact potential difference (CPD) in Kelvin probe force microscopy (KPFM) is crucial in order to extract meaningful information about the sample.
Brown, Keith A. +2 more
core +1 more source
Interface Dipole : Effects on Threshold Voltage and Mobility for both Amorphous and Poly-crystalline Organic Field Effect Transistors [PDF]
, 2014 We report a detailed comparison on the role of a self-assembled monolayer (SAM) of dipolar molecules on the threshold voltage and charge carrier mobility of organic field-effect transistor (OFET) made of both amorphous and polycrystalline organic ...
Celle, C. +8 more
core +3 more sources