Results 31 to 40 of about 4,697 (147)

Photocatalytic activity of nitrogen-doped TiO2-based nanowires: a photo-assisted Kelvin probe force microscopy study [PDF]

, 2011
The emerging industrial business partnerships, which feature cross-functional and cross-company development efforts, raise the barrier for the establishment of effective knowledge sharing practices in the larger organization.
A McAfee, B Chandrasekaran, BR Katzy, C Loebecke, D Richards, DA Pitta, DN Walton, EJ Conklin, EM Kern, F Sellini, FM Shipman, HA Simon, HP Grice, HWJ Rittel, J Bordeau, J Browne, J Füller, J Lipnack, JS Brown, JT Boardman, K Patrick, KM Saridakis, M Hardwick, M Klein, MD Gross, MM Appleyard, MM Tseng, MV Ribiere, MW McElroy, N Cross, P Prekop, P Rosenzweig, PD Ericksen, PM Gangi Di, R Goodwin, T Allen, T Flanagan, T Pardessus, TW Malone, WH Davidow, Y Jin   +40 more
core   +2 more sources

Kelvin probe force microscopy in liquid using electrochemical force microscopy

Beilstein Journal of Nanotechnology, 2015
Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface.
Liam Collins, Stephen Jesse, Jason I. Kilpatrick, Alexander Tselev, M. Baris Okatan, Sergei V. Kalinin, Brian J. Rodriguez   +6 more
doaj   +1 more source

An upper bound for the magnetic force gradient in graphite

, 2010
Cervenka et al. have recently reported ferromagnetism along graphite steps. We present Magnetic Force microscopy (MFM) data showing that the signal along the steps is independent of an external magnetic field.
Agustina Asenjo, David Martínez-Martín, H. Luth, Julio Gómez-Herrero, Miriam Jaafar, Rubén Pérez   +5 more
core   +1 more source

Physical Study by Surface Characterizations of Sarin Sensor on the Basis of Chemically Functionalized Silicon Nanoribbon Field Effect Transistor

, 2016
Surface characterizations of an organophosphorus (OP) gas detector based on chemically functionalized silicon nanoribbon field-effect transistor (SiNR-FET) were performed by Kelvin Probe Force Microscopy (KPFM) and ToF-SIMS, and correlated with changes ...
Carella, A., Dubois, E., Guerin, D., Lenfant, S., Melin, T., Ordronneau, L., Passi, V., Simonato, J. P., Smaali, K., Vuillaume, D.   +9 more
core   +4 more sources

Research Update: Nanoscale surface potential analysis of MoS2 field-effect transistors for biomolecular detection using Kelvin probe force microscopy

APL Materials, 2016
We used high-resolution Kelvin probe force microscopy (KPFM) to investigate the immobilization of a prostate specific antigen (PSA) antibody by measuring the surface potential (SP) on a MoS2 surface over an extensive concentration range (1 pg/ml–100 μg ...
Min Hyung Kim, Heekyeong Park, Hyungbeen Lee, Kihwan Nam, Seokhwan Jeong, Inturu Omkaram, Dae Sung Yoon, Sei Young Lee, Sunkook Kim, Sang Woo Lee   +9 more
doaj   +1 more source

Surface potential imaging and characterizations of a GaN p-n junction with Kelvin probe force microscopy

AIP Advances, 2020
We applied Kelvin probe force microscopy (KPFM) to characterize the p-n junction grown on hydride vapor-phase epitaxy GaN wafers with three different doses of the p-type dopant Mg.
Tomonori Nakamura, Nobuyuki Ishida, Keisuke Sagisaka, Yasuo Koide   +3 more
doaj   +1 more source

Conduction of topologically-protected charged ferroelectric domain walls

, 2011
We report on the observation of nanoscale conduction at ferroelectric domain walls in hexagonal HoMnO3 protected by the topology of multiferroic vortices using in situ conductive atomic force microscopy, piezoresponse force microscopy, and kelvin-probe ...
J. R. Guest, M. E. Lines, N. Lee, P. M. Chaikin, S.-W. Cheong, Weida Wu, Y. Horibe   +6 more
core   +1 more source

AFM tip characterization by Kelvin probe force microscopy [PDF]

, 2010
Reliable determination of the surface potential with spatial resolution is key for understanding complex interfaces that range from nanostructured surfaces to molecular systems to biological membranes. In this context, Kelvin probe force microscopy (KPFM)
Barth, C., Bieletzki, M., Esch, F., Foster, Adam S., Heiz, U., Henry, C. R., Hynninen, T.   +6 more
core   +3 more sources

High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes [PDF]

, 2012
Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force.
Brown, Keith A., Satziner, Kevin J., Westervelt, Robert M.   +2 more
core   +1 more source

Near-equilibrium measurement of quantum size effects using Kelvin probe force microscopy

, 2017
In nano-structures such as thin films electron confinement results in the quantization of energy levels in the direction perpendicular to the film. The discretization of the energy levels leads to the oscillatory dependence of many properties on the film
Hoffmann-Vogel, Regina, León, Carmen Pérez, Marz, Michael, Popp, Matthias, Späth, Thomas   +4 more
core   +1 more source