Results 41 to 50 of about 4,697 (147)
Formation of double ring patterns on Co2MnSi Heusler alloy thin film by anodic oxidation under scanning probe microscope [PDF]
, 2013 Double ring formation on Co2MnSi (CMS) films is observed at electrical breakdown voltage during local anodic oxidation (LAO) using atomic force microscope (AFM).
Budhani, R. C. +3 more
core +2 more sources
Optical and Electrical Properties of TiO2/Co/TiO2 Multilayer Films Grown by DC Magnetron Sputtering
Advances in Condensed Matter Physics, 2018 Transparent oxide multilayer films of TiO2/Co/TiO2 were grown on glass substrate by DC magnetron sputtering technique. The optical and electrical properties of these films were analyzed with the aim of substituting ITO substrate in optoelectronic devices.
Marcos G. Valluzzi +4 more
doaj +1 more source
Advanced Materials Interfaces, 2023 Few binding events are here shown to elicit an extended work function change in a large‐area Au‐surface biofunctionalized with ≈108 capturing antibodies.
Cinzia Di Franco +6 more
doaj +1 more source
MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy
Crystals, 2020 A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko +3 more
doaj +1 more source
Dual-heterodyne Kelvin probe force microscopy
Beilstein Journal of Nanotechnology, 2023 We present a new open-loop implementation of Kelvin probe force microscopy (KPFM) that provides access to the Fourier spectrum of the time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force ...
Benjamin Grévin +3 more
doaj +1 more source
ARMScope – the versatile platform for scanning probe microscopy systems
Metrology and Measurement Systems, 2020 Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator.
Świadkowski Bartosz +8 more
doaj +1 more source
Nanoscale photovoltage mapping in CZTSe/CuxSe heterostructure by using kelvin probe force microscopy
Materials Research Express, 2020 In the present work, kelvin probe force microscopy (KPFM) technique has been used to study the CZTSe/Cu _x Se bilayer interface prepared by multi-step deposition and selenization process of metal precursors.
Manoj Vishwakarma +4 more
doaj +1 more source
High–low Kelvin probe force spectroscopy for measuring the interface state density
Beilstein Journal of Nanotechnology, 2023 The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface states with high spatial resolution using high and low AC bias frequencies compared with the cutoff frequency of the carrier ...
Ryo Izumi +3 more
doaj +1 more source
Beilstein Journal of Nanotechnology, 2018 In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM).
Yann Almadori +4 more
doaj +1 more source
Exploring the Electrical Properties of Twisted Bilayer Graphene [PDF]
, 2019 Two-dimensional materials exhibit properties unlike anything else seen in conventional substances. Electrons in these materials are confined to move only in the plane.
Greenlee, Byron D. +4 more
core +1 more source