Results 1 to 10 of about 5,489 (182)

Implementation of data-cube pump–probe KPFM on organic solar cells [PDF]

Beilstein Journal of Nanotechnology, 2020
An implementation of pump–probe Kelvin probe force microscopy (pp-KPFM) is reported that enables recording the time-resolved surface potential in single-point mode or over a 2D grid. The spectroscopic data are acquired in open z-loop configuration, which
Benjamin Grévin, Olivier Bardagot, Renaud Demadrille   +2 more
exaly   +3 more sources

KPFM surface photovoltage measurement and numerical simulation [PDF]

EPJ Photovoltaics, 2019
A method for the analysis of Kelvin probe force microscopy (KPFM) characterization of semiconductor devices is presented. It enables evaluation of the influence of defective surface layers.
Marchat Clément, Connolly James P., Kleider Jean-Paul, Alvarez José, Koduvelikulathu Lejo J., Puel Jean Baptiste   +5 more
doaj   +2 more sources

Band structure alignment in transfer-free MOCVD grown 2D-TMDC heterostructures revealed by ambient KPFM

APL Materials
Kelvin Probe Force Microscopy (KPFM) under laser illumination is employed to investigate the band structure of MoS2–WS2 heterostructures and its impact on charge carrier separation at the heterointerface.
M. Abdelbaky, Y. Beckmann, J. Klein, T. G. Fabunmi, N. Stracke, A. Grundmann, M. Heuken, H. Kalisch, A. Vescan, T. Kümmell, W. Mertin, G. Bacher   +11 more
doaj   +2 more sources

Scratch testing for micro- and nanoscale evaluation of tribocharging in DLC films containing silver nanoparticles using AFM and KPFM techniques

Surface and Coatings Technology, 2014
Laura Camila Diniz dos Santos, Marcos Massi, Priscila Maria Sarmeiro Corrêa Marciano Leite   +2 more
exaly   +2 more sources

Quantitative investigation of plasmonic hot-electron injection by KPFM [PDF]

Applied Surface Science, 2019
Aoqun Jian, Shengbo Sang, Xuming Zhang
exaly   +2 more sources

Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM

Physical Chemistry Chemical Physics, 2010
Teemu Hynninen, Marina Pivetta, Friedrich Esch   +2 more
exaly   +3 more sources

Revealing of InP multi-layer stacks from KPFM measurements in the dark and under illumination

EPJ Photovoltaics, 2022
Solar cells are complex devices, being constituted of many layers and interfaces. The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. This paper applies Kelvin probe force microscopy (
da Lisca Mattia, Connolly James P., Alvarez José, Mekhazni Karim, Vaissiere Nicolas, Decobert Jean, Kleider Jean-Paul   +6 more
doaj   +1 more source

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Beilstein Journal of Nanotechnology, 2022
Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in ...
Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li   +2 more
doaj   +1 more source

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

Beilstein Journal of Nanotechnology, 2022
In this paper, we derive and present quantitative expressions governing the performance of single and multifrequency Kelvin probe force microscopy (KPFM) techniques in both air and water.
Jason I. Kilpatrick, Emrullah Kargin, Brian J. Rodriguez   +2 more
doaj   +1 more source

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

Beilstein Journal of Nanotechnology, 2021
The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be
Gheorghe Stan, Pradeep Namboodiri
doaj   +1 more source