Diamond for High-Power, High-Frequency, and Terahertz Plasma Wave Electronics. [PDF]
Hasan MM, Wang C, Pala N, Shur M.
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Model Development for Threshold Voltage Stability Dependent on High Temperature Operations in Wide-Bandgap GaN-Based HEMT Power Devices. [PDF]
Huang H, Li F, Sun Z, Cao Y.
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Hybrid Piezo-Electromagnetic Device Designed to Harvest the Vibrations of the Human Body. [PDF]
Zărnescu GC +2 more
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A high-efficiency transformer-in-package isolated DC-DC converter using glass-based fan-out wafer-level packaging. [PDF]
Cheng L, Chen Z, Yu D, Pan D.
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A Wireless, Multicolor Fluorescence Image Sensor Implant for Real-Time Monitoring in Cancer Therapy. [PDF]
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SCR-LDMOS. A novel LDMOS device with ESD robustness
12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094), 2002A novel lateral power device structure with a very high degree of ESD (electrostatic discharge) robustness is presented. This device called the SCR-LDMOS is a modification of the lateral LDMOSFET with good on state and blocking characteristics.
S. Pendharkar +5 more
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An Oscillator Based on LDMOS Capacitor
2009 Sixth International Conference on Information Technology: New Generations, 2009The characteristic curve of the ordinary MOS capacitor is not monotonic, whereas the Laterally Diffused MOS (LDMOS) capacitor has a nearly ideal monotonic property. An oscillator based on LDMOS capacitor is designed and implemented using the standard 0.5µm CMOS technology, and various essential factors have been considered, such as the layout size, the
Wei-hai Huang +3 more
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Compact modeling of high-voltage LDMOS devices including quasi-saturation [PDF]
—The surface-potential-based compact transistor model, MOS Model 20 (MM20), has been extended with a quasi-saturation, an effect that is typical for LDMOS devices with a long drift region.
W J Kloosterman
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Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices
Microelectronics Reliability, 2016Abstract This paper presents a comparative study on the electrostatic discharge (ESD) characteristics of Lateral Diffused Metal-Oxide-Semiconductor (LDMOS) and LDMOS with embedded silicon controlled rectifier (LDMOS-SCR) by using transmission line pulsing (TLP) measurements. Results show that the safe operating area (SOA) of LDMOS shrank pronouncedly
Zhihui Yu +5 more
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A novel double RESURF LDMOS for HVIC's
Microelectronics Journal, 2004Abstract The viability of a fully implanted double RESURF technology using a linearly varying doping of p-layer at the surface [Electron. Lett. 32 (12) (1996) 1092–1093] is demonstrated for the first time. Incorporating such a layer allows the drift region charge to be doubled without degradation of breakdown voltage.
S. Hardikar +4 more
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