Dependability Assessment of NAND Flash-memory for Mission-critical Applications [PDF]
It is a matter of fact that NAND flash memory devices are well established in consumer market. However, it is not true that the same architectures adopted in the consumer market are suitable for mission critical applications like space.
Fabiano, Michele
core
Storage Media Technology Usb Flash Drive [PDF]
, 2008 USB Flash Drive is a type of NAND-type flash memory combined with a USB 1.1 or 2.0 and used as data storage devices smaller and lighter. Because of the sophistication that has made USB Flash Drive becoming increasingly popular as an alternative ...
Fivtatianti H, SKom, MM Fivtatianti H, SKom, MM +1 more
core
Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory [PDF]
We evaluated the effects of heavy ion and proton irradiation for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of identical density in the multiple-cell level (MLC) storage mode.
Chen, Dakai +6 more
core +1 more source
Variable-Node-Based Belief-Propagation Decoding With Message Pre-Processing for NAND Flash Memory
IEEE Access, 2019 With the fast development of non-volatile storage technology, NAND flash memory faces more and more challenges such as data reliability and lifetime. To overcome the issue of the reliability, low-density parity-check (LDPC) codes are considered as a main
Xingcheng Liu, Guojun Yang, Xuechen Chen
doaj +1 more source
Investigation of the Connection Schemes between Decks in 3D NAND Flash. [PDF]
Micromachines (Basel), 2023 Jia J, Jin L, You K, Zhu A.
europepmc +1 more source
Electronics LettersThis paper proposes a simple yet effective scheme for NAND Flash memories that employ on‐chip microcontroller units (MCUs) to manage internal array operations.
Geonu Kim
doaj +1 more source
Memcapacitor Crossbar Array with Charge Trap NAND Flash Structure for Neuromorphic Computing. [PDF]
Adv Sci (Weinh), 2023 Hwang S, Yu J, Song MS, Hwang H, Kim H.
europepmc +1 more source
A Novel Program Scheme for Z-Interference Improvement in 3D NAND Flash Memory. [PDF]
Micromachines (Basel), 2023 Jia J, Jin L, Jia X, You K.
europepmc +1 more source
Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory. [PDF]
Micromachines (Basel), 2023 You K, Jin L, Jia J, Huo Z.
europepmc +1 more source
Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory. [PDF]
Micromachines (Basel), 2023 An U +6 more
europepmc +1 more source