Results 111 to 120 of about 208,791 (200)

Estimation method for bit upset ratio of NAND flash memory induced by heavy ion irradiation

open access: yesAIP Advances
In order to estimate the bit upset ratio of NAND flash memory induced by heavy ion irradiation, starting from the physical mechanism of the bit upset of NAND flash memory, an analytical model based on statistical methods was developed to describe the ...
Jiangkun Sheng   +9 more
doaj   +1 more source

Random Telegraph Noise in 3D NAND Flash Memories. [PDF]

open access: yesMicromachines (Basel), 2021
Spinelli AS   +3 more
europepmc   +1 more source

A Scalable Bidimensional Randomization Scheme for TLC 3D NAND Flash Memories. [PDF]

open access: yesMicromachines (Basel), 2021
Favalli M   +4 more
europepmc   +1 more source

Memorie Flash a NAND

open access: yes
In questa tesi verranno trattate le memorie Flash. Partendo da una breve introduzione all'argomento, si studierà prima il funzionamento a livello fisico del transistor, il suo inserimento in un'architettura a NAND e i metodi di accesso e scrittura del dati in tale contesto.
openaire   +1 more source

Radiation Tests of Highly Scaled, High-Density, Commercial, Nonvolatile NAND Flash Memories - Update 2010

open access: yes, 2010
High-density, commercial, nonvolatile flash memories with NAND architecture are now available from several manufacturers. This report examines SEE effects and TID response in single-level cell (SLC) and multi-level cell (MLC) NAND flash memories ...
Nguyen, Duc N., Irom, Farokh
core  

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