Results 91 to 100 of about 930 (165)

Incremental Pulse-Width Erase (IPWE) Scheme for Fast and Variation-Tolerant GIDL Erase of 3D NAND Flash. [PDF]

Micromachines (Basel)
Park Y, Shim W.
europepmc   +1 more source

Enhanced programming efficiency in vertical NAND flash using self-boosting hot carrier injection. [PDF]

Sci Rep
Kim M, Hong J, Kim C, Kim SJ, Hwang S, Baik SJ, Jeon J.   +6 more
europepmc   +1 more source

CMOS-compatible ferroelectric NAND flash memory for high-density, low-power, and high-speed three-dimensional memory. [PDF]

Sci Adv, 2021
Kim MK, Kim IJ, Lee JS.
europepmc   +1 more source

Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory. [PDF]

Nano Converg
Park SH, Im J, Ko J, Hwang J, Yang Y, Back JW, Koo RH, Lee IS, Shin D, Oh M, Jung G, Lee JH.   +11 more
europepmc   +1 more source

Wordline Input Bias Scheme for Neural Network Implementation in 3D-NAND Flash. [PDF]

Biomimetics (Basel)
Hwang H, Kim G, Yu D, Kim H.
europepmc   +1 more source

Enabling scalable ferroelectric-based future generation vertical NAND flash with bonding-friendly architecture: strategies for erase and disturb optimization. [PDF]

Nanoscale Adv
Song I, Kim J, Lee S, Myeong I.
europepmc   +1 more source

Middle Interlayer Engineered Ferroelectric NAND Flash Overcoming Reliability and Stability Bottlenecks for Next-Generation High-Density Storage Systems. [PDF]

Adv Sci (Weinh)
Kim G, Lee S, Choi H, Jung Y, Kim W, Park S, Seo K, Kim K, Kim W, Ha D, Shin M, Ahn J, Jeon S.   +12 more
europepmc   +1 more source

Balancing Page Endurance Variation Between Layers to Extend 3D NAND Flash Memory Lifetime. [PDF]

Micromachines (Basel)
Wang J, Fan Y, Du Y, Huang S, Wan Y.
europepmc   +1 more source

Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional nand Flash Memories. [PDF]

Micromachines (Basel)
Refaldi DG, Malavena G, Chiavarone L, Spinelli AS, Monzio Compagnoni C.   +4 more
europepmc   +1 more source