Memcapacitor Crossbar Array with Charge Trap NAND Flash Structure for Neuromorphic Computing. [PDF]
Adv Sci (Weinh), 2023 Hwang S, Yu J, Song MS, Hwang H, Kim H.
europepmc +1 more source
IEEE Open Journal of the Communications SocietyAs data storage demands continue to grow, ensuring the reliability of NAND flash devices after a large number of Program/Erase (P/E) cycles have elapsed has become a critical requirement.
G. Achala +3 more
doaj +1 more source
A Novel Program Scheme for Z-Interference Improvement in 3D NAND Flash Memory. [PDF]
Micromachines (Basel), 2023 Jia J, Jin L, Jia X, You K.
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LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives
, 2015 The reliability of the non-volatile NAND flash memories, measured in terms of Raw Bit Error Rate (RBER), is reaching critical levels for traditional error detection and correction.
Cristian Zambelli +9 more
core +1 more source
Electronics LettersThis paper proposes a simple yet effective scheme for NAND Flash memories that employ on‐chip microcontroller units (MCUs) to manage internal array operations.
Geonu Kim
doaj +1 more source
Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory. [PDF]
Micromachines (Basel), 2023 You K, Jin L, Jia J, Huo Z.
europepmc +1 more source
Design and implementation of MLC NAND flash-based DBMS for mobile devices
, 2009 Recently, Multi-Level Cell (MLC) NAND flash memory is becoming widely used as storage media for mobile devices such as mobile phones, MP3 players, PDAs and digital cameras.
Kim, Hyojun +4 more
core +1 more source
Self-Adaption of the GIDL Erase Promotes Stacking More Layers in 3D NAND Flash. [PDF]
Micromachines (Basel), 2023 Yang T, Zhang B, Wang Q, Jin L, Xia Z.
europepmc +1 more source
On the soft information extraction from hard-decision outputs in MLC NAND flash memory
, 2012 On the soft information extraction from hard-decision outputs in MLC NAND flash ...
Jinho Choi (13076106) +2 more
core
Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory. [PDF]
Micromachines (Basel), 2023 An U +6 more
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