Results 31 to 40 of about 10,782 (198)

System-Technology Codesign of 3-D NAND Flash-Based Compute-in-Memory Inference Engine

open access: yesIEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 2021
Due to its ultrahigh density and commercially matured fabrication technology, 3-D NAND flash memory has been proposed as an attractive candidate of inference engine for deep neural network (DNN) workloads.
Wonbo Shim, Shimeng Yu
doaj   +1 more source

Self-Learning Hot Data Prediction: Where Echo State Network Meets NAND Flash Memories [PDF]

open access: yes, 2020
© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new ...
Ai, Jiaqiu   +4 more
core   +2 more sources

An SVM-Based NAND Flash Endurance Prediction Method

open access: yesMicromachines, 2021
NAND flash memory is widely used in communications, commercial servers, and cloud storage devices with a series of advantages such as high density, low cost, high speed, anti-magnetic, and anti-vibration.
Haichun Zhang   +5 more
doaj   +1 more source

Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers [PDF]

open access: yes, 2015
NAND flash memories are becoming the predominant technology in the implementation of mass storage systems for both embedded and high-performance applications.
Carlo S. Di   +19 more
core   +2 more sources

A novel gate-all-around with back-gate (GAAB) 3D NAND flash memory structure for high performance with disturbance-less program operation

open access: yesMemories - Materials, Devices, Circuits and Systems, 2023
In this paper, we propose a gate-all-around with back-gate (GAAB) 3D NAND flash memory structure for high performance and reliability. First, in the selected string, we confirmed that the proposed structure can improve program performance using negative ...
Jae-Min Sim   +6 more
doaj   +1 more source

EDACs and test integration strategies for NAND flash memories [PDF]

open access: yes, 2010
Mission-critical applications usually presents several critical issues: the required level of dependability of the whole mission always implies to address different and contrasting dimensions and to evaluate the tradeoffs among them. A mass-memory device
Michele Fabiano   +8 more
core   +2 more sources

Analysis of Residual Stresses Induced in the Confined 3D NAND Flash Memory Structure for Process Optimization

open access: yesIEEE Journal of the Electron Devices Society, 2022
In flash memory technology, mechanical stress is considered as one of the major factors that can influence the device performance. Furthermore, mechanical stress can have a greater impact on the electrical performance in 3D NAND than in 2D NAND because ...
Eun-Kyeong Jang   +4 more
doaj   +1 more source

Schemes for Privacy Data Destruction in a NAND Flash Memory

open access: yesIEEE Access, 2019
We propose schemes for efficiently destroying privacy data in a NAND flash memory. Generally, even if privacy data is erased from NAND flash memories, there is a high probability that the data will remain in an invalid block. This is a management problem
Na-Young Ahn, Dong Hoon Lee
doaj   +1 more source

Energy-Efficient Streaming Using Non-volatile Memory [PDF]

open access: yes, 2008
The disk and the DRAM in a typical mobile system consume a significant fraction (up to 30%) of the total system energy. To save on storage energy, the DRAM should be small and the disk should be spun down for long periods of time.
Dijk, Hylke W. van   +2 more
core   +2 more sources

A NAND Flash Memory Controller for SD/MMC Flash Memory Card [PDF]

open access: yes2006 13th IEEE International Conference on Electronics, Circuits and Systems, 2006
In this paper, a novel NAND Flash Memory Controller was designed. A t-EC w-bit parallel BCH ECC code was designed for correcting the random bit errors of the flash memory chip, which is suitable for the randomly bit errors property and parallel I/O interface of the NAND type Flash memory. A Code-Banking mechanism was designed for the trade-offs between
Chuan-Sheng Lin   +3 more
openaire   +2 more sources

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