Results 231 to 240 of about 29,909,859 (245)
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Gate Leakage Mechanisms in AlGaN/GaN and AlInN/GaN HEMTs: Comparison and Modeling

IEEE Transactions on Electron Devices, 2013
Amitava Dasgupta   +2 more
exaly  

Tri-Gate Normally-Off GaN Power MISFET

IEEE Electron Device Letters, 2012
Elison Matioli, Tomás Palacios, Bin Lu
exaly  

Physical Insights Into the Impact of p-GaN Sidewall Passivation on Gate Leakage, Threshold Voltage Instability, and Gate Breakdown Behavior in p-GaN Gate AlGaN/GaN HEMTs

IEEE Transactions on Electron Devices
Rasik Rashid Malik   +4 more
openaire   +1 more source

Impact of Gate Metal on the Performance of p-GaN/AlGaN/GaN High Electron Mobility Transistors

IEEE Electron Device Letters, 2015
Yuh-Renn Wu, JianJang Huang, Finella Lee
exaly  

High-Voltage p-GaN HEMTs With OFF-State Blocking Capability After Gate Breakdown

IEEE Electron Device Letters, 2019
Renqiang Zhu, Kei May Lau, LYU Qifeng
exaly  

Effect of Gate Leakage in the Subthreshold Characteristics of AlGaN/GaN HEMTs

IEEE Electron Device Letters, 2008
Tomás Palacios   +2 more
exaly  

Gate Switching Lifetime of P-Gate GaN HEMT: Circuit Characterization and Generalized Model

IEEE Transactions on Power Electronics
Yuhao Zhang, Bixuan Wang, Qihao Song
exaly  

Enhanced Gate Reliability and High Threshold Voltage p-GaN HEMT With p-NiO/p-GaN Heterojunction

2026 IEEE 38th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Jinbing Wang   +11 more
openaire   +1 more source

Uncertainty-Aware Gate-Lifetime Prediction of p-GaN Gate HEMTs Using Gaussian Processes

2025 9th International Conference on System Reliability and Safety (ICSRS)
Shuoyan Zhao   +6 more
openaire   +1 more source

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