Results 221 to 230 of about 43,262 (231)
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Time-Dependent Failure of GaN-on-Si Power HEMTs With p-GaN Gate
IEEE Transactions on Electron Devices, 2016Isabella Rossetto +2 more
exaly
Gate Leakage Mechanisms in AlGaN/GaN and AlInN/GaN HEMTs: Comparison and Modeling
IEEE Transactions on Electron Devices, 2013Naveen Karumuri +2 more
exaly
Uncertainty-Aware Gate-Lifetime Prediction of p-GaN Gate HEMTs Using Gaussian Processes
2025 9th International Conference on System Reliability and Safety (ICSRS)Shuoyan Zhao +6 more
openaire +1 more source
Gate Switching Lifetime of P-Gate GaN HEMT: Circuit Characterization and Generalized Model
IEEE Transactions on Power ElectronicsBixuan Wang, Qihao Song, Yuhao Zhang
exaly
Improved Gate ESD Behaviors of p-GaN Power HEMTs by Hybrid Gate Technology
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)Yanfeng Ma +13 more
openaire +1 more source
Modeling of the gate leakage and forward gate reliability in Schottky-gate p-GaN HEMTs
Carlo De Santi +13 moreopenaire +1 more source
Impact of Gate Dielectrics on Electrical Characteristics of p-GaN Gate Enhancement Mode MISHEMT
2024 1st International Conference on Trends in Engineering Systems and Technologies (ICTEST)Sreelekshmi P. S., Jobymol Jacob
openaire +1 more source
Gate leakage modeling and reliability in forward gate bias of p-GaN HEMTs with Schottky-gate
Carlo De Santi +13 moreopenaire +1 more source
TLP effects on normally-off p-GaN gate power HEMTs with Schottky gate
C. De Santi +7 moreopenaire +1 more source