Results 181 to 190 of about 25,827,177 (224)
Some of the next articles are maybe not open access.

Review of technology for normally-off HEMTs with p-GaN gate

Materials Science in Semiconductor Processing, 2018
Owing to the high carrier density and high electron mobility of the two dimensional electron gas (2DEG), high electron mobility transistors (HEMTs) based on gallium nitride (GaN) are suitable devices for high power and high frequency applications. Clearly, the presence of the 2DEG at the interface of AlGaN/GaN heterostructures makes HEMTs intrinsically
G Greco, F Iucolano, F Roccaforte
openaire   +3 more sources

A Novel Digital Etch Technique for p-GaN Gate HEMT

2018 IEEE International Conference on Semiconductor Electronics (ICSE), 2018
We demonstrate the digital etching (DE) process to fabricated E-mode p-GaN/AIGaN/GaN HEMT. DE process comprising low power oxygen (02) plasma oxidizing and low power boron trichloride (BCl 3 ) plasma etching to selectively remove p-GaN layer. The atomic layer etching (ALE) has an etching rate of 1.62 nm/cycle to achieved depth of 70nm.
Yuan Lin   +5 more
openaire   +1 more source

Impact of Gate Offset on PBTI of p-GaN Gate HEMTs

2022 IEEE International Reliability Physics Symposium (IRPS), 2022
Ethan S. Lee   +3 more
openaire   +1 more source

Charge trapping related channel modulation instability in P-GaN gate HEMTs

Microelectronics Reliability, 2016
Abstract In this paper, a study of the channel modulation instability of commercial p-GaN gate HEMTs is presented. During the gate-voltage stress test, substantial RDS(ON) variations up to 78 mΩ (93.8%) were observed. It is found that the p-GaN/AlGaN/GaN gate structure enables the injection of holes and electrons, which can be captured by the donor ...
Xueyang Li   +3 more
openaire   +1 more source

Investigation of the Progressive Gate Breakdown Behaviors in p-GaN Gate HEMTs

IEEE Transactions on Electron Devices, 2023
Xin Chao   +5 more
openaire   +1 more source

Simulation Study of p-GaN Gate HEMTs With Dielectric Interlayer

2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS), 2023
Shiyin Zhang   +3 more
openaire   +1 more source

Reliability Evaluation of p-GaN Gate HEMTs in Bootstrap Circuit

2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2022
Yan Cheng   +6 more
openaire   +1 more source

Study of TaN-Gated p-GaN E-Mode HEMT

IEEE Transactions on Electron Devices, 2023
Rijo Baby   +5 more
openaire   +1 more source

Simulation model for a GaN-HEMT with Schottky p-GaN-Gate

2021
Neuartige Leistungstransistoren mit weitem Bandabstand aus den Materialien Siliziumkarbid (SiC) und Galliumnitrid (GaN) bieten im Vergleich zu Silizium-Schaltern die Möglichkeit, Systeme mit gesteigerten Schaltfrequenzen zu realisieren. Aufgrund der auftretenden schnellen Schalt- und Stromanstiegsgeschwindigkeiten steigt der Einfluss der parasitären ...
openaire   +1 more source

Improved Gate Reliability Normally-Off p-GaN/AlN/AlGaN/GaN HEMT With AlGaN Cap-Layer

IEEE Electron Device Letters, 2021
Hsuan-Ling Kao   +2 more
exaly  

Home - About - Disclaimer - Privacy