Results 171 to 178 of about 269 (178)
Some of the next articles are maybe not open access.

Gate current degradation model of the AlGaAs/InGaAs PHEMT

Wuli Xuebao/Acta Physica Sinica, 2013
exaly  

Measurement based study of microwave double channel pHEMT device

International Journal of Electronics
Mohammad Abdul Alim, Mayahsa M Ali
exaly  

Enhancement/depletion PHEMT device

2013
CHINI ALESSANDRO, LANZIERI CLAUDIO
openaire   +1 more source

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