Results 151 to 160 of about 95,287 (195)
Some of the next articles are maybe not open access.
Plasma-enhanced atomic layer deposition for plasmonic TiN
Nanophotonic Materials XIII, 2016This work presents the low temperature plasma-enhanced atomic layer deposition (PE-ALD) of TiN, a promising plasmonic synthetic metal. The plasmonics community has immediate needs for alternatives to traditional plasmonic materials (e.g. Ag and Au), which lack chemical, thermal, and mechanical stability.
Lauren M. Otto +7 more
openaire +1 more source
Plasma-enhanced atomic layer deposition of zinc phosphate
Journal of Non-Crystalline Solids, 2016Abstract Zinc phosphate thin films were grown by plasma-enhanced atomic layer deposition (ALD) using a sequence of trimethyl phosphate (TMP, Me 3 PO 4 ) plasma, O 2 plasma, and diethylzinc (DEZn, Et 2 Zn) exposures. The film growth was monitored by in-situ spectroscopic ellipsometry.
T. Dobbelaere +4 more
openaire +1 more source
Room Temperature Copper Seed Layer Deposition by Plasma-Enhanced Atomic Layer Deposition
ECS Transactions, 2011AbaCus, a newly developed fluorine-free precursor has been used for room temperature copper deposition using plasma enhanced chemical vapor deposition (PEALD). This process has been characterized and the film properties investigated in term of composition, deposition rate, resistivity, grain size and platability.
Jiajun Mao +4 more
openaire +1 more source
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2015
Atomic layer deposition (ALD) relies on a sequence of self-limiting surface reactions for thin film growth. The effect of non-ALD side reactions, from insufficient purging between pulses and from precursor self-decomposition, on film growth is well known.
Triratna Muneshwar, Ken Cadien
openaire +1 more source
Atomic layer deposition (ALD) relies on a sequence of self-limiting surface reactions for thin film growth. The effect of non-ALD side reactions, from insufficient purging between pulses and from precursor self-decomposition, on film growth is well known.
Triratna Muneshwar, Ken Cadien
openaire +1 more source
Atomic-scale characterization of plasma-induced damage in plasma-enhanced atomic layer deposition
Applied Surface Science, 2017Abstract Plasma-enhanced atomic layer deposition (PE-ALD) has many advantages for the deposition of thin films. However, an appropriate control of the plasma frequency in the PE-ALD process is required to reduce the plasma-induced damage of the thin films during deposition. In this study, we comparatively studied the effects of conventional 13.56 MHz,
Kim, Kangsik +3 more
openaire +2 more sources
Plasma-Enhanced Atomic Layer Deposition of Silver Thin Films
Chemistry of Materials, 2011Thermal properties of various silver precursors known in the literature were evaluated in order to discover which precursor is the most suitable one for plasma-enhanced atomic layer deposition (PEALD) of silver thin films. Ag(fod)(PEt3) (fod = 2,2-dimethyl-6,6,7,7,8,8,8-heptafluorooctane-3,5-dionato) was found to be the best choice. Using Ag(fod)(PEt3)
Sajavaara Timo +7 more
openaire +2 more sources
ACS Applied Materials & Interfaces, 2021
Interfaces govern thermal transport in a variety of nanostructured systems such as FinFETs, interconnects, and vias. Thermal boundary resistances, however, critically depend on the choice of materials, nanomanufacturing processes and conditions, and the planarity of interfaces.
Heungdong Kwon +5 more
openaire +2 more sources
Interfaces govern thermal transport in a variety of nanostructured systems such as FinFETs, interconnects, and vias. Thermal boundary resistances, however, critically depend on the choice of materials, nanomanufacturing processes and conditions, and the planarity of interfaces.
Heungdong Kwon +5 more
openaire +2 more sources
Journal of Vacuum Science & Technology A, 2022
Atomic layer etching driven by self-limiting thermal reactions has recently been developed as a highly conformal and isotropic technique for low damage atomic scale material removal by sequential exposures of vapor phase reactants. Gallium oxide (Ga2O3) is currently among the materials of interest due to a large variety of applications including power ...
Kevin A. Hatch +2 more
openaire +1 more source
Atomic layer etching driven by self-limiting thermal reactions has recently been developed as a highly conformal and isotropic technique for low damage atomic scale material removal by sequential exposures of vapor phase reactants. Gallium oxide (Ga2O3) is currently among the materials of interest due to a large variety of applications including power ...
Kevin A. Hatch +2 more
openaire +1 more source
Plasma Enhanced Atomic Layer Deposition of TaN Thin Films
ECS Meeting Abstracts, 2010Abstract not Available.
Paul Ma, Jiang Lu
openaire +1 more source
Plasma-enhanced atomic layer deposition of superconducting niobium nitride
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2016Thin films of niobium nitride are useful for their physical, chemical, and electrical properties. NbN superconducting properties have been utilized in a wide range of applications. Plasma-enhanced atomic layer deposition (PEALD) of NbN with (t-butylimido) tris(diethylamido) niobium(V) and remote H2/N2 plasmas has been investigated.
Mark J. Sowa +7 more
openaire +1 more source

