All HfO<sub><i>x</i></sub>-Resistive Switches with the Conducting Oxygen Vacancy Exchange Layer and Self-Limited Oxide Layer. [PDF]
Schreyer P +14 more
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Compute-in-memory implementation of state space models for event sequence processing. [PDF]
Zhang X +6 more
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Memristor-Based Artificial Neural Networks for Hardware Neuromorphic Computing. [PDF]
Jin B, Wang Z, Wang T, Meng J.
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11-bit two-dimensional floating-gate memories. [PDF]
Wang Y +11 more
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Reset-Voltage Controlled Resistance-State and Applications of Forming-Free Fe-Doped SrTiO3 Thin-Film Memristor. [PDF]
Lee KJ +5 more
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Interface-Induced Synaptic Performance in CeO<sub>2</sub>/La<sub>0.8</sub>Ba<sub>0.2</sub>MnO<sub>3</sub> Oxygen Reservoir Junction. [PDF]
Rathod KN +7 more
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In situ observation of oxygen ion dynamics in topological phase change memristors through self-assembled interface design. [PDF]
Li K +15 more
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Study of the Characteristics of Ba0.6Sr0.4Ti1-xMnxO3-Film Resistance Random Access Memory Devices. [PDF]
Chen KH +4 more
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Recent progress of resistive switching random access memory (RRAM)
2012 IEEE Silicon Nanoelectronics Workshop (SNW), 2012This paper gives an overview of recent works on metal oxide resistive switching memory (RRAM). We explored the stochastic nature of resistive switching in metal oxide RRAM and a 2-D analytical solver was established to explain the switching parameter variations in HfOx-based RRAM.
Shimeng Yu +2 more
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Resistive switching characteristics of novel Al-inserted resistive random access memory (RRAM)
2010 IEEE Nanotechnology Materials and Devices Conference, 2010Resistive switching characteristics are investigated for aluminum (Al) inserted NiO resistive switching random access memory (RRAM) by adapting cross-pointed structure. In order to evaluate high-density RRAM with low switching current, we have shown the relationships between various important analytical parameters and reset current reduction.
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