Results 21 to 30 of about 9,132 (212)

Transverse Scaling of Schottky Barrier Charge-Trapping Cells for Energy-Efficient Applications

open access: yesCrystals, 2020
This work numerically elucidates the effects of transverse scaling on Schottky barrier charge-trapping cells for energy-efficient applications. Together with the scaled gate structures and charge-trapping dielectrics, variations in bias conditions on ...
Hung-Jin Teng   +5 more
doaj   +1 more source

An atomistic view on the Schottky barrier lowering applied to SrTiO3/Pt contacts

open access: yesAIP Advances, 2019
The interface between a metal and a semiconductor is known as Schottky contact and a key factor in semiconductor technologies. Those interfaces normally build an energetic barrier, which is responsible for the exponential current voltage dependence ...
C. Funck, S. Menzel
doaj   +1 more source

A method for improving the betavoltaic cell’s conversion efficiency: Using the alloy as Schottky metal

open access: yesAIP Advances, 2022
Under the irradiation of a 63Ni source, the Al/diamond Schottky barrier diode and 2198 Al–Li alloy/diamond Schottky barrier diode can convert decay energy into electrical energy.
Yu Wang   +7 more
doaj   +1 more source

Waveguide Schottky photodetector with tunable barrier based on Ti3C2Tx/p-Si van der Waals heterojunction

open access: yesNanophotonics, 2021
MXene, a new advanced two-dimensional material, has attracted great attention in energy storage, transparent electrodes, and electromagnetic shielding due to its high conductivity, high specific surface area, and hydrophilic surface.
Yang Changming   +6 more
doaj   +1 more source

Effect of Schottky barrier height lowering on resistance degradation of Fe-doped SrTiO3 thin-film capacitor

open access: yesAIP Advances, 2021
It is generally believed that the resistance degradation behavior of bulk and thin-film oxide capacitors arises from the oxygen vacancy migration within the oxide and/or the charge injection at the oxide/electrode interface.
Feng Xue
doaj   +1 more source

Impact of Silicon Wafer Orientation on the Performance of Metal Source/Drain MOSFET in Nanoscale Regime: a Numerical Study [PDF]

open access: yesJournal of Nanostructures, 2012
A comprehensive study of Schottky barrier MOSFET (SBMOSFET) scaling issue is performed to determine the role of wafer orientation and structural parameters on the performance of this device within Non-equilibrium Green's Function formalism.
Z. Ahangari, M. Fathipour
doaj   +1 more source

Experimental and Theoretical Studies of Mo/Au Schottky Contact on Mechanically Exfoliated β-Ga2O3 Thin Film

open access: yesNanoscale Research Letters, 2019
We studied the reverse current emission mechanism of the Mo/β-Ga2O3 Schottky barrier diode through the temperature-dependent current-voltage (I-V) characteristics from 298 to 423 K.
Zhuangzhuang Hu   +10 more
doaj   +1 more source

Electrically Tunable Ideality Factor and Series Resistance of Gate-Controlled Graphene/Pentacene Schottky Junctions

open access: yesIEEE Journal of the Electron Devices Society
Gate-tunable Schottky barrier diodes find many applications in logic transistors, photodiodes, and sensors. In this work, the electrical properties of Schottky barrier diodes with graphene/pentacene junctions and additional gates were investigated in ...
Tae Yoon Lee   +3 more
doaj   +1 more source

Investigation of significantly high barrier height in Cu/GaN Schottky diode

open access: yesAIP Advances, 2016
Current-voltage (I-V) measurements combined with analytical calculations have been used to explain mechanisms for forward-bias current flow in Copper (Cu) Schottky diodes fabricated on Gallium Nitride (GaN) epitaxial films.
Manjari Garg   +4 more
doaj   +1 more source

Thermal Annealing Behaviour on Electrical Properties of Pd/Ru Schottky Contacts on n-Type GaN [PDF]

open access: yesЖурнал нано- та електронної фізики, 2011
We have investigated the electrical properties of Pd/Ru Schottky contacts on n-GaN as a function of annealing temperature by current-voltage (I-V) and capacitance-voltage (C-V) measurements.
N. Nanda Kumar Reddy, V. Rajagopal Reddy
doaj  

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