Plasmon-Induced Graphene/Silicon Schottky Junctions for Ultrasensitive Gas Sensing. [PDF]
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Beyond Point-like Defects in Bulk Semiconductors: Junction Spectroscopy Techniques for Perovskite Solar Cells and 2D Materials. [PDF]
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The ESD Robustness and Protection Technology of P-GaN HEMT. [PDF]
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Multiscale Modeling of the RESET Sweep in a Single-Layer MoS<sub>2</sub> Atomristor Using Density Functional Theory. [PDF]
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2D Indium Oxide at the Epitaxial Graphene/SIC Interface: Synthesis, Structure, Properties, and Devices. [PDF]
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Modulating Persistent Photoconductivity through Barrier Engineering for High-performance and Multifunctional Two-dimensional Optoelectronic Devices. [PDF]
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We present a comparison between the thermal sensing behaviors of 4H-SiC Schottky barrier diodes, junction barrier Schottky diodes, and PiN diodes in a temperature range from 293 K to 573 K. The thermal sensitivity of the devices was calculated from the slope of the forward voltage versus temperature plot.
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