Results 21 to 30 of about 14,138 (303)

Materials and Processes for Schottky Contacts on Silicon Carbide [PDF]

open access: yesMaterials, 2021
Silicon carbide (4H-SiC) Schottky diodes have reached a mature level of technology and are today essential elements in many applications of power electronics. In this context, the study of Schottky barriers on 4H-SiC is of primary importance, since a deeper understanding of the metal/4H-SiC interface is the prerequisite to improving the electrical ...
Vivona M, Giannazzo F, Roccaforte F
openaire   +3 more sources

Electron spin injection at a Schottky contact [PDF]

open access: yesPhysical Review B, 2002
We investigate theoretically electrical spin injection at a Schottky contact between a spin-polarized electrode and a non-magnetic semiconductor. Current and electron density spin-polarizations are discussed as functions of barrier energy and semiconductor doping density. The effect of a spin-dependent interface resistance that results from a tunneling
Albrecht, J. D., Smith, D. L.
openaire   +2 more sources

Enhanced Non-Uniformity Modeling of 4H-SiC Schottky Diode Characteristics Over Wide High Temperature and Forward Bias Ranges

open access: yesIEEE Journal of the Electron Devices Society, 2020
A practical model, adequate for full reproduction of inhomogeneous Schottky diodes' forward characteristics over wide high-temperature and bias ranges, is proposed.
Gheorghe Brezeanu   +5 more
doaj   +1 more source

Assessment of Linear, Hexagonal, and Octagonal Cell Topologies for 650 V 4H-SiC Inversion-Channel Planar-Gate Power JBSFETs Fabricated With 27 nm Gate Oxide Thickness

open access: yesIEEE Journal of the Electron Devices Society, 2021
A 27 nm gate oxide thickness has been successfully used for manufacturing high performance 650V 4H-SiC planar-gate, inversion-channel power JBSFETs in a 6-inch commercial foundry with three (Linear, Hexagonal, and Octagonal) cell topologies.
Aditi Agarwal, Kijeong Han, B. J. Baliga
doaj   +1 more source

Fundamentals of low-resistive 2D-semiconductor metal contacts: an ab-initio NEGF study

open access: yesnpj 2D Materials and Applications, 2023
Metal contacts form one of the main limitations for the introduction of 2D materials in next-generation scaled devices. Through ab-initio simulation techniques, we shed light on the fundamental physics and screen several 2D and 3D top and side contact ...
Rutger Duflou   +3 more
doaj   +1 more source

Rectifying Schottky Contact in ZrN/Polycrystalline p-Ge

open access: yesIEEE Journal of the Electron Devices Society, 2023
Fermi-level pinning (FLP) at the metal/Ge interface makes it difficult to control the Schottky barrier height, which forces an ohmic behavior on p-Ge and a rectifying behavior on n-Ge.
Kenta Moto   +5 more
doaj   +1 more source

A generalized drift-diffusion model for rectifying Schottky contact simulation [PDF]

open access: yes, 2010
We present a discussion on the modeling of Schottky barrier rectifying contacts (diodes) within the framework of partial-differential-equation-based physical simulations.
Bonani, Fabrizio   +11 more
core   +1 more source

Novel TCAD oriented definition of the off-state breakdown voltage in Schottky-gate FETs: a 4H SiC MESFET case study [PDF]

open access: yes, 2008
Physics-based breakdown voltage optimization in Schottky-barrier power RF and microwave field-effect transistors as well as in high-speed power-switching diodes is today an important topic in technology computer-aided design (TCAD).
Bonani, Fabrizio   +3 more
core   +1 more source

Electrodeposition of Ni-Si Schottky barriers [PDF]

open access: yes, 2005
Electrodeposition is being used to fabricate magnetic microstructures directly on patterned n-type Si wafers of various substrate resistivities.
P.A.J. de Groot   +13 more
core   +1 more source

Comparison between modulations of contact and channel potential in nitrogen dioxide gas response of ambipolar carbon nanotube field-effect transistors

open access: yesAIP Advances, 2022
Carbon nanotubes (CNTs) are promising materials for gas sensing because of their large specific area and high sensitivity to charge differentiation.
Shota Nakahara   +5 more
doaj   +1 more source

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