Results 111 to 120 of about 1,030 (185)

Dynamic Performance Evaluation of Bidirectional Bridgeless Interleaved Totem-Pole Power Factor Correction Boost Converter. [PDF]

Micromachines (Basel)
Cheng HC, Jhu WY, Liu YC, Zheng DW, Liu YC, Chang TC.   +5 more
europepmc   +1 more source

Structurally optimized SiC CMOS FinFET for high-temperature and low-power SoC logic integration. [PDF]

Sci Rep
Kwon TS, Yoon YJ, Park DY, Bae JH, Song YS, Kim HW, Seo JH, Woo SY.   +7 more
europepmc   +1 more source

Novel 4H-SiC Double-Trench MOSFETs with Integrated Schottky Barrier and MOS-Channel Diodes for Enhanced Breakdown Voltage and Switching Characteristics. [PDF]

Nanomaterials (Basel)
Wang P, Li C, Deng C, Yang Q, Xu S, Tang X, Wang Z, Tao W, Tao N, Wang Q, Yu H.   +10 more
europepmc   +1 more source

Sensorless Junction Temperature Estimation of Onboard SiC MOSFETs Using Dual-Gate-Bias-Triggered Third-Quadrant Characteristics. [PDF]

Sensors (Basel)
Lu Y, Ding Y, Li J, Yin H, Li X, Zhu C, Zhang X.   +6 more
europepmc   +1 more source

Performance evaluation of a bi-directional synchronous H6 inverter for AC/DC system interaction with SiC and Si-Based at different switching frequencies. [PDF]

PLoS One
Alshammari MS, Namadmalan A, Duffy M.
europepmc   +1 more source

Power-Law Time Exponent <i>n</i> and Time-to-Failure in 4H-SiC MOSFETs: Beyond Fixed Reaction-Diffusion Theory. [PDF]

Micromachines (Basel)
Dhyani M, Singh S, Tzhayek N, Bernstein JB.   +3 more
europepmc   +1 more source

A 3.3 kV SiC Semi-Superjunction MOSFET with Trench Sidewall Implantations. [PDF]

Micromachines (Basel)
Boccarossa M, Melnyk K, Renz AB, Gammon PM, Kotagama V, Shah VA, Maresca L, Irace A, Antoniou M.   +8 more
europepmc   +1 more source

SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation. [PDF]

Micromachines (Basel)
Metreveli A, Hallén A, Zetterling CM.
europepmc   +1 more source

Nondestructive detection and identification of electrically active threading dislocations in n⁺-SiC substrates. [PDF]

Nanoscale Adv
Kurniawan IS, Sevilla RC, Hsu HM, Soebroto RJ, Wu CB, Shen JL, Huang HY, Li WC, Yuan CT.   +8 more
europepmc   +1 more source

Influence of Electrical Transients and A/D Converter Dynamics on Thermal Resistance Measurements of Power MOSFETs. [PDF]

Sensors (Basel)
Górecki K, Posobkiewicz K.
europepmc   +1 more source