Results 81 to 90 of about 1,030 (185)

Research on the Techniques of High Power SiC-MOSFET Driver

open access: yes机车电传动, 2018
In order to adapt to the characteristics of SiC-MOSFET, such as faster switching speed, lower loss but lower threshold voltage and weaker short-circuit capacity compared to Si-IGBT, the key techniques of SiC-MOSFET driver was analyzed, including drain ...
ZHOU Shuai   +4 more
doaj  

Thermal Management and Experimental Validation of a Copper-Inlay PCB for SiC MOSFETs in High-Power EV Fast Chargers

open access: yesIEEE Open Journal of Power Electronics
Efficient thermal management is essential to ensure reliability and performance in high-power electric vehicle (EV) fast-charging converters employing silicon carbide (SiC) MOSFETs.
Muhammad Awais   +5 more
doaj   +1 more source

Impact of gamma-ray irradiation on commercial silicon carbide MOSFET with boost converter application

open access: yesPower Electronic Devices and Components
This paper study impact of gamma-ray irradiation on the characteristics of silicon carbide power metal oxide semiconductor field effect transistor (SiC MOSFET) from CREE, Inc., and its corresponding effects on the operation of 5/12 V DC-DC boost ...
S. M. Abd El-Azeem, W. Abd El-Basit
doaj   +1 more source

Research on Switching Characteristics of 3 300 V Full SiC MOSFET Power Module

open access: yes机车电传动, 2020
Depending on the advantages of SiC MOSFET with faster switching and lower on-state losses, the switching characteristics of a 3 300 V full SiC MOSFET device were studied to make better use of the device. Firstly, the switching processes of the SiC device
Kangkang SUN   +5 more
doaj  

Threshold voltage instability in SiC power MOSFETs

open access: yes, 2019
Charge trapping and de-trapping phenomena in SiC power MOSFETs were investigated by performing two different types of electrical characterization: hysteresis and positive bias temperature instability (PBTI) measurements. A positive stress voltage to the gate results in positive threshold voltage shift (ΔVT), which can be fully recovered by applying a ...
Giuseppe Consentino   +5 more
openaire   +3 more sources

SiC MOSFET with Integrated SBD Device Performance Prediction Method Based on Neural Network. [PDF]

open access: yesMicromachines (Basel)
Niu X   +10 more
europepmc   +1 more source

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