Results 241 to 250 of about 852,844 (264)
Some of the next articles are maybe not open access.
Basic mechanisms and modeling of single-event upset in digital microelectronics
IEEE Transactions on Nuclear Science, 2003P E Dodd, L W Massengill
exaly
Monte Carlo Simulation of Single Event Effects
IEEE Transactions on Nuclear Science, 2010Robert A Weller +2 more
exaly
Single Event crosstalk shielding for CMOS logic
Microelectronics Journal, 2009Selahattin Sayil
exaly
Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops
IEEE Transactions on Nuclear Science, 2011B L Bhuva, L W Massengill, W T Holman
exaly
Atmospheric neutron single event effect test on Xilinx 28 nm system on chip at CSNS-BL09
Microelectronics Reliability, 2019Weitao Yang, Zhiliang Hu, Chaohui He
exaly

