Results 21 to 30 of about 16,668,686 (260)

Experimental Setups for Single Event Effect Studies [PDF]

, 2016
Experimental setups are being prepared to test and to qualify electronic devices regarding their tolerance to Single Event Effect (SEE). A multiple test setup and a new beam line developed especially for SEE studies at the São Paulo 8 UD Pelletron ...
S. G. Alberton, Aguiar, V. A. P., Added, N., Macchione, E. L. A., Alberton, S. G., Silveira, M. A. G., Aguirre, F., Medina, N. H., Benfica, J., Vargas, F., Porcher, B., MEDINA, NILBERTO H., VARGAS, FABIAN, Fernando Aguirre, Fabian Luis Vargas, AGUIRRE, F. R., SILVEIRA, M. A. G.; Guazzelli, Marcilei A., Marcilei Aparecida Guazzelli da Silva, Nemitala Added, Eduardo L. A. Macchione, Alberton, S.G., Vitor Ângelo Paulino de Aguiar, Bruno Casagrande Porcher, AGUIAR, VITOR A. P.   +23 more
core   +1 more source

Single-event effect testing of the PNI RM3100 magnetometer for space applications [PDF]

Geoscientific Instrumentation, Methods and Data Systems, 2022
The results of a destructive single-event effect susceptibility radiation test of the PNI RM3100 magnetometer sensor, specifically the MagI2C ASIC (application-specific integrated circuit) on the sensor board are presented.
M. B. Moldwin, E. Wilcox, E. Zesta, T. M. Bonalsky   +3 more
doaj   +1 more source

Propagazione di single-event transients in logiche combinatorie [PDF]

, 2022
Lo scopo di questa trattazione è quello di studiare la propagazione dei SET (Single-Event Transients) in catene di inverter implementate a partire da porte logiche di tipo NOT NOR e NAND, tramite l’ausilio di un simulatore tridimensionale.
Bevilacqua, Andrea
core  

The Analysis on Space Radiation Environment and Effect of the KOMPSAT-2 Spacecraft(II): Single Event Effect [PDF]

Journal of Astronomy and Space Sciences, 2001
In this paper, space radiation environment and single event effect(SEE) have been analyzed for the KOMPSAT-2 operational orbit. As spacecraft external and internal space environment, trapped proton, SEP(solar energetic particle) and GCR(galactic cosmic ...
Myung-Jin Baek, Day-Young Kim, Hak-Jung Kim   +2 more
doaj  

Single Event Effects in CMOS Image Sensors [PDF]

, 2012
In this work, 3T Active Pixel Sensors (APS) are exposed to heavy ions (N, Ar, Kr, Xe), and Single Event Effects (SEE) are studied. Devices were fully functional during exposure, no Single Event Latch-up (SEL) or Single Event Functional Interrupt (SEFI ...
Goiffon, Vincent, Lalucaa, Valerian, Rolland, Guy, Petit, Sophie, Magnan, Pierre   +4 more
core   +1 more source

Current Single Event Effect Test Results for Candidate Spacecraft Electronics [PDF]

, 1997
We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics.
Tull E G Stassinopoulos, Amy K Moran, Donald K Hawkins, Paul Marshall, James Kinnison, Bliss Carkhuff, James E Forney, Jackson, Hak S Kim, Christina M Seidleck, Kenneth A Label, Anthony B Sanders   +11 more
core   +1 more source

Characterization of single event effect simulation in InP-based High Electron Mobility Transistors

Results in Physics, 2022
The characteristics and mechanism of single event effects (SEEs) in InP-based High Electron Mobility Transistors (HEMTs) are investigated by technology computer-aided design (TCAD) simulations.
Shuxiang Sun, Linshuang Liu, Haitao Wu, Ruxian Yao, Hongying Mei, Hua Wen, Yinghui Zhong   +6 more
doaj   +1 more source

Incidents and Accidents: The Way of the Single Event Tester [PDF]

, 2017
When performing a single event effect (SEE) test during a test campaign, flexibility and out of the box thinking is often required for unexpected and unplanned ...
Kenneth A. LaBel, LaBel, Kenneth A.
core   +1 more source

Study on Single-event Gate Rupture Mechanism of Asymmetric-trench SiC MOSFET

Yuanzineng kexue jishu
The demand for kilovolt-level radiation-hardened SiC devices in modern spacecraft is urgent. To provide a theoretical basis for the hardening design of SiC MOSFETs against single-event gate rupture (SEGR), a study on the single-event effects of 1 200 V ...
WANG Lihao1, 2, DONG Tao2, FANG Xingyu2, QI Xiaowei2, WANG Liang2, CHEN Miao2, ZHANG Xing1, ZHAO Yuanfu2
doaj   +1 more source

A New Type of Si-Based MOSFET for Radiation Reinforcement

Micromachines
This paper thoroughly analyses the role of drift in the sensitive region in the single-event effect (SEE), with the aim of enhancing the single-particle radiation resistance of N-type metal-oxide semiconductor field-effect transistors (MOSFETs).
Weifeng Liu, Zhirou Zhou, Dong Zhang, Jianjun Song   +3 more
doaj   +1 more source