Results 31 to 40 of about 853,175 (263)

System effects of single event upsets [PDF]

7th Computers in Aerospace Conference, 1989
Single Event Upsets (SEUs) pose a serious threat to computer reliability and longevity. SEU effects are found at sea level, in airborne avionics, and in space. At the system level, SEUs in processors are controlled by replication and voting, watchdog processors, and tagged data schemes.
openaire   +1 more source

Cup‐Like Nuclei Is a Hallmark of DUX4/ERG Acute Lymphoblastic Leukemia and Reveals Cytoplasmic Mitochondria Accumulation

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Cup‐like nuclei are a distinctive morphological feature observed in certain cases of acute lymphoblastic leukemia (ALL). We provide evidence that they characterize DUX4/ERG ALL independently of IKZF1 deletion and reveal marked mitochondrial accumulation in this ALL subset.
Chloé Arfeuille, Hugo Roux, Odile Fenneteau, Aurélie Caye‐Eude, Alexia Kinoo, Yoann Vial, André Baruchel, Marion Strullu, Elodie Lainey, Hélène Cavé   +9 more
wiley   +1 more source

The Combined Effect of Obesity and Contraceptive Use on Pulmonary Embolism in Adolescent Females Residing in the United States

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Combined oral contraceptive (COC) use in obese adult women dramatically increases the relative risk of developing a pulmonary embolism (PE). The risk of a PE in obese adolescent females taking contraceptives is currently unknown. The purpose of this investigation was to determine the effect of body mass index (BMI) and contraceptive
John Puetz, Joanne Salas
wiley   +1 more source

Single event effects in the pixel readout chip for BTeV [PDF]

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2003
15 pages, 6 Postscript ...
Chiodini, G., Appel, J. A., Cardoso, G., Christian, D. C., Coluccia, M. R., Hoff, J., Kwan, S. W., Mekkaoui, A., Yarema, R., Zimmermann, S.   +9 more
openaire   +2 more sources

A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits

Micromachines
With the rapid development of semiconductor technology, the reduction in device operating voltage and threshold voltage has made integrated circuits more susceptible to the effects of particle radiation. Moreover, as process sizes decrease, the impact of
Rui Dong, Hongliang Lu, Caozhen Yang, Yutao Zhang, Ruxue Yao, Yujian Wang, Yuming Zhang   +6 more
doaj   +1 more source

Simulation of Single-Event Transient Effect for GaN High-Electron-Mobility Transistor

Micromachines, 2023
A GaN high-electron-mobility transistor (HEMT) was simulated using the semiconductor simulation software Silvaco TCAD in this paper. By constructing a two-dimensional structure of GaN HEMT, combined with key models such as carrier mobility, the effects ...
Zhiheng Wang, Yanrong Cao, Xinxiang Zhang, Chuan Chen, Linshan Wu, Maodan Ma, Hanghang Lv, Ling Lv, Xuefeng Zheng, Wenchao Tian, Xiaohua Ma, Yue Hao   +11 more
doaj   +1 more source

Are Fertility Preservation Procedures Before Gonadotoxic Therapy and Hematopoietic Stem Cell Transplantation Feasible and Safe in Very Young Children? A Retrospective Cohort Study

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Fertility preservation (FP) is increasingly integrated into the care of pediatric patients exposed to gonadotoxic therapy or conditioning for hematopoietic stem cell transplantation (HSCT), yet perioperative data in infants and toddlers remain scarce.
Kerstin Saalabian, Yannick Braun, Till‐Martin Theilen, Anke Barnbrock, Theresa Rohm, Fabienne Hammant, Nicole Sänger, Aynura Abbasova‐Semiz, Jan‐Henning Klusmann, Thomas Klingebiel, Udo Rolle, Peter Bader, Henning C. Fiegel, Andrea Jarisch   +13 more
wiley   +1 more source

Simulation Study on Single-Event Burnout Reliability of 900V 4H-SiC Quasi Vertical Double Diffused MOSFET

IEEE Access
In this work, the single-event burnout (SEB) performance and reasons of the proposed 900V SiC quasi-vertical double diffusion MOSFET with deepened drain (T-QVDMOSFET) are analyzed from the spatial distribution of physical quantities such as power density,
Jin-Ke Shi, Ying Wang, Xin-Xing Fei, Biao Sun, Yan-Xing Song, Yu-Qian Liu, Wei Zhang   +6 more
doaj   +1 more source

A platform design of single event effect mitigation for SRAM-based FPGA

Dianzi Jishu Yingyong, 2019
Be aimed at application requirements of VLSI(very large scale integration) in space environment, current researching status in China and abroad of radiation harden of FPGA are introduced in the paper.
Qi Liuyu, Liu Guodong, Zhao Zhengyang
doaj   +1 more source

Study of White Neutron Source at CYCIAE-100 for Single Event Effect Irradiation Experiment

Yuanzineng kexue jishu, 2023
Neutron-induced single event effects have potential influence on the reliability of electronic devices in aircraft and ground-based nuclear facilities. The white neutron source, generated by heavy metal target bombardment from proton accelerators, is an ...
CHEN Qiming;BAO Jie;MA Xu;GUO Gang*;ZHAO Shuyong;ZHANG Zheng;HAN Jinhua;ZHANG Fuqiang;LI Wangtian
doaj   +1 more source