Results 31 to 40 of about 852,844 (264)

The Analysis on Space Radiation Environment and Effect of the KOMPSAT-2 Spacecraft(II): Single Event Effect [PDF]

Journal of Astronomy and Space Sciences, 2001
In this paper, space radiation environment and single event effect(SEE) have been analyzed for the KOMPSAT-2 operational orbit. As spacecraft external and internal space environment, trapped proton, SEP(solar energetic particle) and GCR(galactic cosmic ...
Myung-Jin Baek, Day-Young Kim, Hak-Jung Kim   +2 more
doaj  

Analysis of Single Event Effects on Embedded Processor [PDF]

Electronics, 2021
The continuous scaling of electronic components has led to the development of high-performance microprocessors which are even suitable for safety-critical applications where radiation-induced errors, such as single event effects (SEEs), are one of the most important reliability issues.
Azimi, Sarah, De Sio, Corrado, Rizzieri, Daniele, Sterpone, Luca   +3 more
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Characterization of single event effect simulation in InP-based High Electron Mobility Transistors

Results in Physics, 2022
The characteristics and mechanism of single event effects (SEEs) in InP-based High Electron Mobility Transistors (HEMTs) are investigated by technology computer-aided design (TCAD) simulations.
Shuxiang Sun, Linshuang Liu, Haitao Wu, Ruxian Yao, Hongying Mei, Hua Wen, Yinghui Zhong   +6 more
doaj   +1 more source

Study on Single-event Gate Rupture Mechanism of Asymmetric-trench SiC MOSFET

Yuanzineng kexue jishu
The demand for kilovolt-level radiation-hardened SiC devices in modern spacecraft is urgent. To provide a theoretical basis for the hardening design of SiC MOSFETs against single-event gate rupture (SEGR), a study on the single-event effects of 1 200 V ...
WANG Lihao1, 2, DONG Tao2, FANG Xingyu2, QI Xiaowei2, WANG Liang2, CHEN Miao2, ZHANG Xing1, ZHAO Yuanfu2
doaj   +1 more source

Impact of JFET Region Width on Single Event Effects of SiC MOSFETs

Yuanzineng kexue jishu, 2023
The advantages of SiC MOSFETs (metal-oxide semiconductor field effect transistor) make this technology attractive for space, avionics and high-energy accelerator applications.
XU Mingkang1;JIA Yunpeng1,*;ZHOU Xintian1;HU Dongqing1;WU Yu1;TANG Yun1;LI Rongjia1;ZHAO Yuanfu1,2;WANG Liang2
doaj   +1 more source

A New Type of Si-Based MOSFET for Radiation Reinforcement

Micromachines
This paper thoroughly analyses the role of drift in the sensitive region in the single-event effect (SEE), with the aim of enhancing the single-particle radiation resistance of N-type metal-oxide semiconductor field-effect transistors (MOSFETs).
Weifeng Liu, Zhirou Zhou, Dong Zhang, Jianjun Song   +3 more
doaj   +1 more source

Synergistic effect of total ionizing dose and single-event upset in the analog/digital converter AD574

Fushe yanjiu yu fushe gongyi xuebao, 2021
This study investigates the AD574, a 12-bit analog/digital converter (ADC) produced by American Analog Devices, Inc. (ADI) using bipolar/I2L technology. The test samples are subjected to a total ionizing dose (TID) of 400 Gy(Si) under 60Co γ irradiation.
XIANG Chuanfeng, YAO Shuai, YU Xin, LI Xiaolong, LU Wu, WANG Xin, LIU Mohan, SUN Jing, GUO Qi, CAI Jiao, YANG Sheng   +10 more
doaj   +1 more source

Single event effects in the pixel readout chip for BTeV [PDF]

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2003
15 pages, 6 Postscript ...
Chiodini, G., Appel, J. A., Cardoso, G., Christian, D. C., Coluccia, M. R., Hoff, J., Kwan, S. W., Mekkaoui, A., Yarema, R., Zimmermann, S.   +9 more
openaire   +2 more sources

Synergistic Effect of TID and SEE in 130 nm 7T SOI SRAM

Yuanzineng kexue jishu
The space environment is a very harsh operating environment, and space radiation can directly affect the operation of electronic devices causing total ionizing dose (TID), single event effect (SEE) and displacement damage (DD).
XIAO Shuyan1, GUO Gang1, WANG Linfei2, ZHANG Zheng1, CHEN Qiming1, GAO Linchun2, WANG Chunlin2, ZHANG Fuqiang1, ZHAO Shuyong1, LIU Jiancheng1
doaj   +1 more source

System effects of single event upsets [PDF]

7th Computers in Aerospace Conference, 1989
Single Event Upsets (SEUs) pose a serious threat to computer reliability and longevity. SEU effects are found at sea level, in airborne avionics, and in space. At the system level, SEUs in processors are controlled by replication and voting, watchdog processors, and tagged data schemes.
openaire   +1 more source