Results 281 to 290 of about 315,481 (343)

Research on Linear Energy Transfer of SiC Materials Based on Monte Carlo Method. [PDF]

Micromachines (Basel)
Xiao J, Xie H, Du S, Wang S, Zhao T, Liu H.   +5 more
europepmc   +1 more source

Evidence-based acupuncture: Methodological insights and challenges in gastroenteroscopy recovery research. [PDF]

World J Gastroenterol
Zhang JL, You LZ.
europepmc   +1 more source

Sarcopenia and chronic pain: Identification of shared genetic determinants and therapeutic implication. [PDF]

Medicine (Baltimore)
Li J, Huang J, Han J.
europepmc   +1 more source

Event-Informed Systematic Self-Reflections and Stress Reactivity Among Emerging Adults: Insights From an Ecological Momentary Assessment Experiment. [PDF]

Stress Health
Stackpole AR, Crane MF, Riddell H, Gucciardi DF.   +3 more
europepmc   +1 more source

Overlap between body composition abnormalities and sex-specific prognostication in decompensated cirrhosis. [PDF]

Front Nutr
Yang J, Song Y, Liu Q, Sun C.
europepmc   +1 more source

Single event upset hardening techniques

, 1990
H. T. Weaver
openalex   +1 more source

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Single event upset mitigation for FDP2008

2011 9th IEEE International Conference on ASIC, 2011
Highly integrated contemporary SRAM-based Field Programmable Gate Arrays (FPGAs) lead to high occurrence-rate of transient faults induced by Single Event Upsets (SEUs) in FPGAs' configuration memory. In this paper, Fudan Design Environment (FDE) Triple Module Redundancy (TMR) approach for design triplication has been devised to meet high-reliability ...
Meng Yang, Gengsheng Chen
openaire   +1 more source

A single event upset tolerant latch design

Microelectronics Reliability, 2018
Abstract This paper presents a single-event-upset tolerant latch design based on a redundant structure featuring four storage nodes (i.e. Quatro). The reference structure manifests single node upset issues when either of the two internal nodes is hit and observes a positive transient afterwards.
Haibin Wang, , Li Chen
exaly   +2 more sources

Single event upset in avionics

IEEE Transactions on Nuclear Science, 1993
Data from military/experimental flights and laboratory testing indicate that typical non-radiation-hardened 64 K and 256 K static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere.
A. Taber, E. Normand
openaire   +1 more source