Results 281 to 290 of about 16,157 (304)

Single Event Upset Detection and Correction

10th International Conference on Information Technology (ICIT 2007), 2007
Jawar Singh, Jimson Mathew, Mohammad Hosseinabady, Dhiraj K. Pradhan   +3 more
openaire   +1 more source

Pruning single event upset faults with petri nets

2009 10th Latin American Test Workshop, 2009
Dependability of embedded systems is becoming a serious concern even for mass-market systems. Usually, designs are verified by means of fault injection campaigns, but the length of a thorough test often collides with the severe requirements about design cycle times.
openaire   +1 more source

Single event upsets in space

21st Aerospace Sciences Meeting, 1983
openaire   +1 more source

Suggested Single Event Upset Figure of Merit

IEEE Transactions on Nuclear Science, 1983
E L Petersen
exaly  

SINGLE EVENT UPSETS IN MICROELECTRONICS

1991
openaire   +1 more source

Single Event Upset Measurements of Gaas E-JFET RAMS

IEEE Transactions on Nuclear Science, 1983
P Shapiro, A B Campbell, R Zuleeg
exaly  

Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS

Microelectronics Journal, 2017
Aibin Yan, Zhengfeng Huang, Yiming Ouyang   +2 more
exaly  

Prevention of Single Event Upsets in Microelectronics

1991
B. L. Bhuva, L. W. Massengill, S. E. Kerns, T. R. Weatherford, J. R. Hauser   +4 more
openaire   +1 more source

Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

IEEE Transactions on Nuclear Science, 1997
K B Crawford, W R Crain, S C Moss
exaly  

Basic mechanisms and modeling of single-event upset in digital microelectronics

IEEE Transactions on Nuclear Science, 2003
P E Dodd, L W Massengill
exaly