Results 301 to 304 of about 16,157 (304)

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

IEEE Transactions on Nuclear Science, 2007
James R Schwank, M R Shaneyfelt, J A Felix   +2 more
exaly  

Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data

IEEE Transactions on Nuclear Science, 1983
exaly  

Single Event Upset Testing with Relativistic Heavy Ions

IEEE Transactions on Nuclear Science, 1984
exaly  

Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset

IEEE Transactions on Circuits and Systems II: Express Briefs
Zhan Zheyu, Liu Hainan, Li Duoli, Ma Quangang, Zhao Wenxin, Yan Zhenzhen, Li Bo   +6 more
openaire   +1 more source