Results 291 to 300 of about 7,421,093 (305)

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

IEEE Transactions on Nuclear Science, 2008
Kenneth A Label, Paul E Dodd, James R Schwank   +2 more
exaly  

A Highly Reliable Memory Cell Design Combined With Layout-Level Approach to Tolerant Single-Event Upsets

IEEE Transactions on Device and Materials Reliability, 2016
Tianqi Wang, Chunhua Qi, Liyi Xiao
exaly  

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

IEEE Transactions on Nuclear Science, 2011
Lloyd Massengill, Bharat Bhuva, Dennis R Ball   +2 more
exaly  

Single Event Upset Rates on 1 Mbit and 256 Kbit Memories: CRUX Experiment on APEX

IEEE Transactions on Nuclear Science, 1995
E G Stassinopoulos, K A Label
exaly  

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

IEEE Transactions on Nuclear Science, 2007
Ronald D. Schrimpf, Kevin M. Warren, James R Schwank   +2 more
exaly  

Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

IEEE Transactions on Nuclear Science, 2011
Lloyd Massengill, Bharat Bhuva, T D Loveless   +2 more
exaly  

Single Event Induced Double Node Upset Tolerant Latch

2010
Kazuteru Namba, Hideo Itô
exaly  

Single Event Upset Cross Sections at Various Data Rates

IEEE Transactions on Nuclear Science, 1996
Stephen P Büchner, R A Reed, M A Carts
exaly  

Single event upset mitigation

2011
TSENG CHEN W, CARMICHAEL CARL H
openaire   +1 more source

TDRS-1 Single Event Upsets and the Effect of the Space Environment

IEEE Transactions on Nuclear Science, 1991
exaly