Results 291 to 300 of about 16,157 (304)

Study Of Single-event-upsets In PAL16R8

1993 IEEE Radiation Effects Data Workshop, 2005
J. Barak, J. Levinson, A. Zentner, D. David, O. Even, M. Hass, D. Ilberg, Y. Lifshitz   +7 more
openaire   +1 more source

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

IEEE Transactions on Nuclear Science, 2011
B L Bhuva, L W Massengill, W T Holman
exaly  

The Variability of Single Event Upset Rates in the Natural Environment

IEEE Transactions on Nuclear Science, 1983
James H Adams
exaly  

Single Event Upset cross sections at various data rates

IEEE Transactions on Nuclear Science, 1996
R A Reed, M A Carts, P W Marshall
exaly  

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

IEEE Transactions on Nuclear Science, 2018
Dakai Chen, Edward P Wilcox, R Ladbury
exaly  

Low‐cost single event double‐upset tolerant latch design

Electronics Letters, 2018
Jianwei Jiang, Weiran Kong
exaly  

Single Event Upset in SOS Integrated Circuits

IEEE Transactions on Nuclear Science, 1987
J Choma, W A Kolasinski
exaly  

Single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation

IEEE Transactions on Nuclear Science, 1999
D M Hiemstra
exaly  

Modification of single event upset cross section of an SRAM at high frequencies

IEEE Transactions on Nuclear Science, 1996
S Büchner, A B Campbell
exaly  

Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections

IEEE Transactions on Nuclear Science, 2013
N J Gaspard, Z J Diggins, K Lilja
exaly