Results 31 to 40 of about 16,109 (304)

A Machine Learning Approach to Predicting Single Event Upsets

CoRR, 2023
A single event upset (SEU) is a critical soft error that occurs in semiconductor devices on exposure to ionising particles from space environments. SEUs cause bit flips in the memory component of semiconductors. This creates a multitude of safety hazards as stored information becomes less reliable.
Archit Gupta, Chong Yock Eng, Deon Lim Meng Wee, Rashna Analia Ahmed, See Min Sim   +4 more
openaire   +2 more sources

Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets

IEEE Access, 2019
This paper presents two novel quadruple cross-coupled memory cell designs, namely QCCM10T and QCCM12T, with protection against single event upsets (SEUs) and double-node upsets (DNUs).
Aibin Yan, Jun Zhou, Yuanjie Hu, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen   +6 more
doaj   +1 more source

Efficacy of Transistor Interleaving in DICE Flip-Flops at a 22 nm FD SOI Technology Node

Applied Sciences, 2022
Fully Depleted Silicon on Insulator (FD SOI) technology nodes provide better resistance to single event upsets than comparable bulk technologies, but upsets are still likely to occur at nano-scale feature sizes, and additional hardening techniques should
Christopher J. Elash, Zongru Li, Chen Jin, Li Chen, Jiesi Xing, Zhiwu Yang, Shuting Shi   +6 more
doaj   +1 more source

Physical Mechanisms Inducing Electron Single-Event Upset

, 2018
International audienceWith the increase of sensitivity of devices to single-event upsets (SEUs), the possibility to trigger an upset with incident electrons has been recently raised.
C. Inguimbert, Caron, Pablo, Bezerra, Françoise, P. Caron, Sukhaseum, Nicolas, L. Artola, Chatry, Nathalie, N. Chatry, Inguimbert, Christophe, N. Sukhaseum, Ecoffet, Robert, Artola, Laurent, F. Bezerra, R. Ecoffet   +13 more
core   +1 more source

Health‐Related Quality of Life and Symptom Severity Among Patients With PIK3CA‐Related Overgrowth Spectrum: A Mixed‐Methods Study to Understand Real‐World Experience With Alpelisib Treatment

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background PIK3CA‐related overgrowth spectrum (PROS) includes several rare overgrowth disorders resulting from somatic gain‐of‐function mutations in PIK3CA. Despite treatment advances, including the recent approval of alpelisib for PROS in the United States, literature detailing the patient experience with PROS is limited.
Vamsi Bollu, Kaitlin LaGasse, Cory D. Saucier, Kimberly Raymond, Miranda Lauher‐Charest, Lauren Crowder, Beilei Cai, Mary Lisha Paul, Denise Adams   +8 more
wiley   +1 more source

Single event upset and mitigation technique in JLTFET based RF mixer

Results in Engineering
This work deals with the study of single event effect (SEE) on RF mixer along with the mitigation technique. A 20 nm independent gate Junctionless Tunnel FET JLTFET (IGJLTFET) was first designed and based on its Id-Vg characteristics; RF mixer circuit ...
Aishwarya K, Lakshmi B
doaj   +1 more source

Estimation of SEU Threshold Energy from Kitsat-1 Data Using AP-8 Model [PDF]

Journal of Astronomy and Space Sciences, 2001
KITSAT-1, launched in 1992, passes through Inner Van Allen Radiation Belt in which high energy protons cause single event upsets(SEUs) in the main memory of KITSAT-1 OBC(On-Board Computer)186.
Sung-Joon Kim, Young Hoon Shin, Sung Soo Kim, Kyoung Wook Min   +3 more
doaj  

Clinical and Biological Features of Response in Resistant Neuroblastoma to 131I‐Metaiodobenzylguanidine Radiotherapy in the Anti‐GD2 Immunotherapy Era

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background 131I‐metaiodobenzylguanidine (131I‐MIBG) radiotherapy is a key treatment for relapsed and refractory (R/R) neuroblastoma (NB). Patients with R/R disease treated in the modern era are increasingly exposed to anti‐GD2 immunotherapy, which exerts selective pressure and may modify both tumor cell state and microenvironment.
Benjamin J. Lerman, Katherine K. Matthay, Fabienne Hollinger, Catriona Black, Ann A. Lazar, Miguel Pampaloni, Steven G. DuBois, Kieuhoa T. Vo   +7 more
wiley   +1 more source

Mechanisms and modeling of single-event upset [PDF]

, 1998
The basic mechanisms of single-event upset are reviewed, including charge collection in silicon junctions and transistors, and properties of single-event upset in CMOS static random access memory (SRAM) cells.
Dodd, Paul E.
core  

Emapalumab for Immune Effector Cell‐Associated Hemophagocytic Lymphohistiocytosis‐Like Syndrome Following CD19‐Directed CAR‐T in Two Patients With B‐ALL: Clinical and Biomarker Correlates

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Immune effector cell‐associated hemophagocytic lymphohistiocytosis‐like syndrome (IEC‐HS) is a life‐threatening hyperinflammatory toxicity distinct from cytokine release syndrome (CRS) and neurotoxicity following chimeric antigen receptor T‐cell (CAR‐T) therapy. In a single‐institution retrospective cohort of pediatric and young adult patients
Thomas J. Galletta, Jeremy D. Rubinstein, Christopher E. Dandoy, Ruby Khoury, Angela Faulhaber, Christine L. Phillips, Christa Krupski   +6 more
wiley   +1 more source