Pion Induced Single Event Upset in the CMS Pixel Detector Readout
, 2000 Single event upset probabilities for 200 MeV pions are compared for SRAM devices implemented in two different radiation hard SOI ...
Gabathuler, Kurt +3 more
core
Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data [PDF]
, 2017 We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment ...
Campola, Michael +3 more
core
Structure‐forward targeting of claudins with synthetic binders
FEBS Letters, EarlyView.Claudins form the paracellular barriers between epithelial and endothelial tissues at tight junctions and are targets for molecular binders with the goal of modulating barrier permeability. Claudin‐binding molecules are relevant in drug delivery or in altering claudin interactions with disease‐causing proteins.
Alex J. Vecchio
wiley +1 more source
Study on Single Event Upset and Mitigation Technique in JLTFET-Based 6T SRAM Cell
Journal of Electrical and Computer EngineeringThe effect of single event transient (SET) on 6T SRAM cell employing a 20 nm silicon-based junctionless tunneling field effect transistor (JLTFET) is explored for the first time. JLTFET-based SRAM circuit is designed using the look up table-based Verilog
Aishwarya K, Lakshmi B
doaj +1 more source
A Soft Error Self-Resilience Radiation-Hardened 14T SRAM for Aerospace Applications
IEEE AccessVarious charged particles in space threaten memory circuit integrity and dependability, including photons, alpha particles, and high-energy ions outside the Low Earth Orbit region.
Guguloth Anjaneyulu +7 more
doaj +1 more source
Towards a single event upset detector based on COTS FPGA
, 2017 The Single Event Upset Detector (SEUD) is 3U CubeSat payload experiment that aims to achieve radiation tolerant computing through detection and correction of SEU bit flips on COTS SRAM FPGAs.
Ngo, Kalle, +5 more
core +1 more source
Single Event Upset tests and failure rate estimation for a front-end ASIC adopted in high-flux-particle therapy applications [PDF]
, 2019 A 64 channels Application Specific Integrated Circuit, named TERA09, designed in a 0.35 m technology for particle therapy applications, has been characterized for Single Event Upset probability.
Sacchi, R. +7 more
core +1 more source
Engineering peptides into antibodies—opportunities and strategies for therapeutic innovation
FEBS Letters, EarlyView.Peptides and antibodies occupy complementary therapeutic niches. Peptides recognize difficult targets in a compact format, while antibodies add specificity, long half‐life, and effector functions. This review examines strategies that merge both modalities—peptide grafting into loops, terminal and Fc fusions, and bioconjugation—highlighting how ...
Jinling Wang +2 more
wiley +1 more source
Simulating Single Event Upset Rate with BERT
, 1994 The circuit level modeling of single event effects is an area of on-giong research.
P. K. Ko +4 more
core
The microbiome in human skin aging
FEBS Letters, EarlyView.Age‐related skin changes encompass the well‐known visible phenotypic alterations, together with microbiome dysbiosis and a series of molecular aging hallmarks. These hallmarks characterize not only a fully stablished aged phenotype but also the skin aging process itself.
Manuel Huerta Arana +3 more
wiley +1 more source