Results 41 to 50 of about 10,455 (213)

The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature

open access: yesJournal of Applied Science & Process Engineering, 2015
This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable
Norhuzaimin Julai
doaj   +1 more source

Single Event Effects in the Pixel readout chip for BTeV [PDF]

open access: yes, 2001
In future experiments the readout electronics for pixel detectors is required to be resistant to a very high radiation level. In this paper we report on irradiation tests performed on several preFPIX2 prototype pixel readout chips for the BTeV experiment
A Mekkaoui   +16 more
core   +2 more sources

Key Technical Fields and Future Outlooks of Space Manipulators: A Survey

open access: yesSmartBot, EarlyView.
This paper systematically reviews the technological development of space manipulators, emphasizing the unique challenges posed by space environments. It examines four areas: structural design, modeling, planning, and control, while introducing typical ground test platforms.
Gang Chen   +12 more
wiley   +1 more source

estar: An R package to measure ecological stability

open access: yesMethods in Ecology and Evolution, EarlyView.
Abstract Assessing ecological stability is a key task in biodiversity monitoring and conservation. Quantifying stability is not trivial because its different aspects can be measured with various properties. However, to date, no software enables measuring different stability properties on ecological time‐series data.
Ludmilla Figueiredo   +6 more
wiley   +1 more source

Evaluation of commercial ADC radiation tolerance for accelerator experiments [PDF]

open access: yes, 2015
Electronic components used in high energy physics experiments are subjected to a radiation background composed of high energy hadrons, mesons and photons. These particles can induce permanent and transient effects that affect the normal device operation.
Chen, Hucheng   +9 more
core   +1 more source

The ecclesiastical fight against storm‐makers in the Latin west

open access: yesEarly Medieval Europe, EarlyView.
This paper studies the strategies used by the Church to fight against the storm‐makers. These figures were said to cause the storms that ruined crops, and during Late Antiquity and the early Middle Ages in the Visigothic and Frankish kingdoms were subject to punishment and constraints.
Juan Antonio Jiménez Sánchez
wiley   +1 more source

Design and Test of Principle Prototype of Space Single Event Upset Discriminating and Positioning System

open access: yesYuanzineng kexue jishu, 2022
Single event upset (SEU) has always been an important factor affecting the reliability of spacecraft electronic equipment, which can cause anomalies in electronic equipment in orbit, and can result in serious spacecraft failure. In order to master signal
ZHAO Zhendong;TAO Wenze;LI Yancun;CHENG Yi;ZHANG Qingxiang;AN Heng;QUAN Xiaoping;ZHANG Chenguang
doaj  

Risk factors associated with owner‐reported sleep disturbances in Nordic horses

open access: yesEquine Veterinary Journal, EarlyView.
Abstract Background Very little is known about sleep disturbances in horses, although several management or animal‐based factors may contribute to an increased risk of disturbances. Objectives To investigate factors related to rest and sleep behaviour of horses kept in stalls as perceived by Nordic horse owners or caretakers and their association with ...
H. Suomala   +4 more
wiley   +1 more source

Single event upset and mitigation technique in JLTFET based RF mixer

open access: yesResults in Engineering
This work deals with the study of single event effect (SEE) on RF mixer along with the mitigation technique. A 20 nm independent gate Junctionless Tunnel FET JLTFET (IGJLTFET) was first designed and based on its Id-Vg characteristics; RF mixer circuit ...
Aishwarya K, Lakshmi B
doaj   +1 more source

Two-photon laser-assisted device alteration in silicon integrated-circuits [PDF]

open access: yes, 2013
Optoelectronic imaging of integrated-circuits has revolutionized device design debug, failure analysis and electrical fault isolation; however modern probing techniques like laser-assisted device alteration (LADA) have failed to keep pace with the ...
Bodoh, Dan   +7 more
core   +1 more source

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