Results 71 to 80 of about 10,455 (213)
SEE Test and Data Analysis for Complex FPGA Systems [PDF]
Critical space applications require knowledge of single event upset (SEU) susceptibility (mission survivability). Generic SEU test and analysis techniques do not provide adequate data for survivability analysis.
Berg, Melanie, Campola, Michael
core +1 more source
Geophysical Research Letters, Volume 53, Issue 4, 28 February 2026.Abstract We examined projected changes in Madden–Julian Oscillation (MJO) teleconnections over North America using 90 ensemble members from the Community Earth System Model Version 2 Large Ensemble (CESM‐LENS2) under the SSP370 scenario. In the warmer climate, the classic PNA‐like teleconnection strengthens and shifts eastward, with large ensemble ...
Jingxuan Cui, Eric D. Maloney
wiley +1 more source
Investigation of Radiation Hardened TFET SRAM Cell for Mitigation of Single Event Upset
IEEE Journal of the Electron Devices Society, 2020 This study analyzes the soft error sensitivity of SRAM cell which employs double-gate tunnel field effect transistor (DG TFET). The mitigation technique for the data recovery after the heavy ion strike is discussed.
M. Pown, B. Lakshmi
doaj +1 more source
Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets of NAND Flash Memory [PDF]
We investigated the single-event effect (SEE) susceptibility of the Micron 16 nm NAND flash, and found the single-event upset (SEU) cross section varied inversely with fluence. The SEU cross section decreased with increasing fluence.
Chen, Dakai +6 more
core +1 more source
Health Science Reports, Volume 9, Issue 2, February 2026.ABSTRACT Background Type 2 diabetes mellitus (T2DM) is increasingly seen as a chronic inflammatory state, with the neutrophil‐to‐lymphocyte ratio (NLR) studied as a new biomarker of systemic inflammation. Evidence links NLR to glycemic control, but its consistency and strength vary.
Maryam Mohammadi +13 more
wiley +1 more source
A guideline for heavy ion radiation testing for Single Event Upset (SEU) [PDF]
A guideline for heavy ion radiation testing for single event upset was prepared to assist new experimenters in preparing and directing tests. How to estimate parts vulnerability and select an irradiation facility is described.
Malone, C., Nichols, D. K., Price, W. E.
core +1 more source
Journal of Extracellular Vesicles, Volume 15, Issue 2, February 2026.Engineered Bacteroides fragilis outer membrane vesicles carrying anti‐IL‐1β scFv and kidney‐targeting peptides alleviate renal inflammation and injury in CKD mouse models via precise delivery and NF‐κB inhibition. ABSTRACT Microinflammation is a key driver of chronic kidney disease (CKD) progression, with interleukin‐1β (IL‐1β) playing a pivotal role ...
Liang Li +6 more
wiley +1 more source
Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory [PDF]
We evaluated the effects of heavy ion and proton irradiation for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of identical density in the multiple-cell level (MLC) storage mode.
Chen, Dakai +6 more
core +1 more source
Non Radiation Hardened Microprocessors in Spaced Based Remote Sensing Systems [PDF]
, 2006 The CALIPSO (Cloud-Aerosol Lidar and Infrared Pathfinder Satellite Observations) mission is a comprehensive suite of active and passive sensors including a 20Hz 230mj Nd:YAG lidar, a visible wavelength Earth-looking camera and an imaging infrared ...
Decoursey, Robert J. +2 more
core +1 more source
Nuclear Engineering and TechnologyThis paper investigates the Single Event Upset (SEU) sensitivity, system-level hardening effectiveness, and potential applications of high-performance 16 nm Field Programmable Gate Arrays (FPGAs) in radiation environments.
Chang Cai +11 more
doaj +1 more source