Results 301 to 310 of about 2,968,943 (344)

Single-event effects in avionics

IEEE Transactions on Nuclear Science, 1996
The occurrence of single-event upset (SEU) in aircraft electronics has evolved from a series of interesting anecdotal incidents to accepted fact. A study completed in 1992 demonstrated that SEUs are real, that the measured in-flight rates correlate with the atmospheric neutron flux, and that the rates can be calculated using laboratory SEU data.
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Single-event effects on SSD controllers

2017 IEEE International Reliability Physics Symposium (IRPS), 2017
With designers employing FF hardening techniques to mitigate soft errors in complex ASICs, low-cost controller ICs have become one of the most vulnerable parts at the system-level. In this paper, SSD controllers are evaluated for neutron soft error performance to estimate their vulnerability.
B. L. Bhuva, S.-J. Wen, R. Wong, A. Garza   +3 more
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SINGLE EVENT EFFECTS IN THE NANO ERA

International Journal of High Speed Electronics and Systems, 2008
Scaling of complementary metal oxide semiconductor (CMOS) technologies to the sub-100 nm dimension regime increase the sensitivity to pervasive terrestrial radiation. Diminishing levels of charge associated with information in electronic circuits, interactions of multiple transistors due to tight packing densities, and high circuit clock speeds make ...
M. L. ALLES, L. W. MASSENGILL, R. D. SCHRIMPF, R. A. WELLER, K. F. GALLOWAY   +4 more
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Single Event Effects in MEMS Accelerometers

2009 IEEE Radiation Effects Data Workshop, 2009
We present single event effects, induced by heavy ions and protons, on a COTS MEMS accelerometer. The testing procedure is outlined and the contributions from different parts of the accelerometer are discussed.
Coumar Oudea, Patrick Poirot, Remi Gaillard, Christian Poivey, Laurent Marchand   +4 more
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Laboratory tests for single-event effects

IEEE Transactions on Nuclear Science, 1996
Integrated circuits are currently tested at accelerators for their susceptibility to single-event effects (SEE's). However, because of the cost and limited accessibility associated with accelerator testing, there is considerable interest in developing alternate testing methods.
S. Buchner, D. McMorrow, J. Melinger, A.B. Camdbell   +3 more
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Single photon absorption laser facility for single event effect testing

2016 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE), 2016
The laser testing facility for single event effects (SEEs) at the Saskatchewan Structural Sciences Centre, University of Saskatchewan is introduced and its principles of operation described. An ultrafast pulsed laser setup is used to investigate the SEE behavior of microelectronic circuits and devices.
Michael Newton, Brook Danger, Li Chen 0001, Ramaswami Sammynaiken, Haibin Wang, David M. Hiemstra, Valeri Kirischian   +6 more
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Single-Event, Enhanced Single-Event and Dose-Rate Effects with Pulsed Proton Beams

IEEE Transactions on Nuclear Science, 1987
Pulsed proton beams can create various upset effects in memory circuits. The response of the IDT 6116RH static RAM to these effects has been investigated over a range of flux extending from a single-event dominated region to a dose-rate dominated region.
M. A. Xapsos, L. W. Massenqill, W. J. Stapor, P. Shapiro, A. B. Campbell, S. E. Kerns, K. W. Fernald, A. R. Knudson   +7 more
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Single Event Effects in NAND Flash Memory Arrays

IEEE Transactions on Nuclear Science, 2005
We are showing for the first time the charge loss due to heavy ion irradiation on Flash memory arrays organized following the NAND architecture. Results complement those previously found for devices featuring a NOR architecture: large charge loss can be expected after the hit of a single ion on a single memory cell.
G. Cellere, A. Paccagnella, A. Visconti, M. Bonanomi, S. Beltrami   +4 more
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Mitigation of Single Event Effects

2016
Mitigation of single event soft errors has taken on growing importance as transistor sizes have decreased. Commercial manufacturers will soon need to address single-event effects as terrestrial radiation sources become a significant source of soft errors in ground-based applications.
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Microbeam studies of single-event effects

IEEE Transactions on Nuclear Science, 1996
The application of heavy-ion microbeam systems to the study of single-event effects is reviewed. Apertured microbeam systems have been used since the early 1980s to study charge collection. This has led to the development of the present models for the transport of charge following heavy-ion strikes in semiconductors. More recently, magnetically focused
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