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Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

IEEE Transactions on Nuclear Science, 2011
Lloyd Massengill   +2 more
exaly  

Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA

2015
Gregory R Allen   +2 more
exaly  

Appreciating the effectiveness of single event effect mitigation techniques

2014 IEEE/AIAA 33rd Digital Avionics Systems Conference (DASC), 2014
openaire   +1 more source

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